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Structural study of self-assembled monolayer of 22-mercapto-1-docosanoic acid on silver(111)SAMANT, M. G; BROWN, C. A; GORDON, J. G et al.Surface science. 1996, Vol 365, Num 3, pp 729-734, issn 0039-6028Article
SHELL-MODEL CALCULATIONS FOR 22NA AND 22NEPREEDOM BM; WILDENTHAL BH.1972; PHYS. REV., C; U.S.A.; DA. 1972; VOL. 6; NO 5; PP. 1633-1644; BIBL. 30 REF.Serial Issue
COMPOSITION PAR FRACTIONS DES OLIGOMERES EPOXY-DIPHENYLOLPROPANEYAROVAYA EP; ZAJTSEVA VV.1981; PLAST. MASSY; ISSN 0554-2901; SUN; DA. 1981; NO 1; PP. 37-38; BIBL. 6 REF.Article
DIE DUENNFILM-HYBRIDSCHALTUNG HAT CHANCENDELFS H.1972; ELEKTRONIK; DTSCH.; DA. 1972; VOL. 21; NO 10; PP. 335-338; BIBL. 7 REF.Serial Issue
CHOICE OF CRITERIA FOR ELLIPSOMETRIC DETERMINATIONS ON THIN FILMSCAMAGNI P; MANARA A.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 13; NO 2; PP. 341-350; BIBL. 14 REF.Serial Issue
PROPRIETES OPTIQUES DE QUELQUES REVETEMENTS ABSORBANTS DANS LE DOMAINE SPECTRAL IRBURKIN AL; NOVIKOV AF.1972; ZH. PRIKL. SPEKTROSK., BELORUS. S.S.R.; S.S.S.R.; DA. 1972; VOL. 17; NO 4; PP. 655-660; BIBL. 6 REF.Serial Issue
GHOST IMAGERY INTENSITY AND DURABILITY OF SELECTED ANTI-REFLECTANT COATINGSPROVINES WF; TARGOVE BD; KISLIN B et al.1973; AMER. J. OPTOM. ARCH. AMER. ACAD. OPTOM.; U.S.A.; DA. 1973; VOL. 50; NO 1; PP. 34-39; BIBL. 6 REF.Serial Issue
CARACTERISTIQUES OPTIQUES DES COUCHES MULTIPLES REFLECHISSANTES A DISPERSION ELEVEE DU DEPHASAGESHKLYAREVSKIJ IN; UMEROV RI; LUPASHKO EA et al.1972; ZH. PRIKL. SPEKTROSK., BELORUS. S.S.R.; S.S.S.R.; DA. 1972; VOL. 17; NO 4; PP. 682-686; BIBL. 10 REF.Serial Issue
DETERMINATION OF THE RELATIVE NITROGEN DOPING LEVEL OF TANTALUM NITRIDE RESISTOR FILM BY MEANS OF THE SEEBECK EFFECTTRUDEL ML.1972; I.E.E.E. TRANS. PARTS HYBR. PACKAG.; U.S.A.; DA. 1972; VOL. 8; NO 3; PP. 16-21; BIBL. 4 REF.Serial Issue
THIN FILMS1972; IN: 1972 INTER. MICROELECTRON. SYMP.; WASHINGTON, D.C.; 1972; PARK RIDGE; INTER. SOC. HYBRID MICROELECTRON.; DA. 1972; PP. (17 P.); BIBL. DISSEM.Conference Paper
ETUDE DES COUCHES MINCES DE TANTALE DEPOSEES PAR PROJECTION CATHODIQUE EN VUE DE DEFINIR LES PARAMETRES PHYSICO-CHIMIQUES PERMETTANT D'OBTENIR DES STRUCTURES BCC, QUADRATIQUE ET POREUSEMOULIN M.1970; DGRST-7072282; FR.; DA. 1970; PP. (40 P.); BIBL. DISSEM.; (RAPP. FINAL, ACTION CONCERTEE: COMPOSANTS CIRCUITS MICROMINIATURISES). 2 FASCReport
ZUR WEITERENTWICKLUNG DER THERMISCHEN ELEKTRONENSTRAHL-BEARBEITUNG DUENNER SCHICHTEN = SUR LES DEVELOPPEMENTS DE LA METHODE DU TRAITEMENT THERMIQUE DE COUCHES MINCES PAR UN FAISCEAU ELECTRONIQUESCHILLER S; HEISIG U; PANZER S et al.1972; NACHR.-TECH.; DTSCH.; DA. 1972; VOL. 22; NO 11; PP. 398-401Serial Issue
DEPLACEMENT ET RUPTURE D'UN FILM DE LIQUIDEUSPENSKIJ VA; KISELEV VM.1972; ZH. PRIKL. KHIM.; S.S.S.R.; DA. 1972; VOL. 45; NO 9; PP. 1996-2000; BIBL. 12 REF.Serial Issue
REVETEMENTS INTERFERENTIELS SPECULAIRES METALLODIELECTRIQUES A SOLIDITE MECANIQUE ACCRUEFURMAN SH A; VVEDENSKIJ VD.1977; OPT.-MEKH. PROMYSHL.; S.S.S.R.; DA. 1977; VOL. 44; NO 5; PP. 41-43; BIBL. 6 REF.Article
THIN FILM HYBRID CIRCUITS.LUNDE JH; SOLEM T.1974; ELECTRON. COMPON.; G.B.; DA. 1974; VOL. 16; NO 17; PP. 11-13 (2P.)Article
RAPID NONDESTRUCTIVE METHOD FOR MEASURING THE REFRACTIVE INDEX AND THICKNESS OF THIN DIELECTRIC FILMSRAIF J; BEN YOSEF N; ORON M et al.1973; J. PHYS. E; G.B.; DA. 1973; VOL. 6; NO 1; PP. 48-50; BIBL. 10 REF.Serial Issue
THE DETERMINATION OF THIN LAYER THICKNESSES WITH AN ELECTRON MICROPROBEBUTZ R; WAGNER H.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 34; NO 3; PP. 693-704; BIBL. 10 REF.Serial Issue
A SIMPLE AND HIGHLY STABLE PHOTOELECTRIC APPARATUS FOR MONITORING THE THICKNESS OF OPTICAL FILMSKIRCHNER H.1973; J. PHYS. E; G.B.; DA. 1973; VOL. 6; NO 5; PP. 430-431; BIBL. 3 REF.Serial Issue
CHANGEMENT DE TOPOGRAPHIE DES CARACTERISTIQUES OPTIQUES D'UN REVETEMENT INTERFERENTIELFURMAN SH A; LEVINA MD.1976; OPT.-MEKH. PROMYSHL.; S.S.S.R.; DA. 1976; VOL. 43; NO 12; PP. 35-37; BIBL. 4 REF.Article
ANISOTROPIC EFFECTS IN THE ELLIPSOMETRY OF "BUILT-UP" FILMS AND DETERMINATION OF THEIR OPTICAL CONSTANTSTOMAR MS; SRIVASTAVA VK.1973; THIN SOLID FILMS; NETHERL.; DA. 1973; VOL. 15; NO 2; PP. 207-215; BIBL. 17 REF.Serial Issue
FORMATION DE COUCHES MAGNETIQUES TEXTUREES POUR CIRCUITS INTEGRESBALYASNIKOV VV; BEKKER YA M.1973; MIKROELEKTRONIKA; S.S.S.R.; DA. 1973; VOL. 2; NO 4; PP. 334-336; BIBL. 4 REF.Serial Issue
ABSORPTION IN TURNING VALUE MONITORING OF NARROW BAND THIN-FILM OPTICAL FILTERSMACLEOD HA.1973; OPT. ACTA; G.B.; DA. 1973; VOL. 20; NO 7; PP. 493-508; ABS. FR. ALLEM.; BIBL. 3 REF.Serial Issue
GRAPHICAL AIDS IN THE USE OF EQUIVALENT INDEX IN MULTILAYER-FILTER DESIGN.UFFORD C; BAUMEISTER P.1974; J. OPT. SOC. AMER.; U.S.A.; DA. 1974; VOL. 64; NO 3; PP. 329-334; BIBL. 8 REF.Article
A THICK AND THIN FILM APPROACH TO FABRICATING MCA SUBSTRATES.CALEY RW.1973; ELECTRON. PACKAG. PRODUCT.; U.S.A.; DA. 1973; VOL. 13; NO 12; PP. 135-149 (12P.); BIBL. 18 REF.Article
COMPARISON OF DRY FILM AND LIQUID PHOTORESIST.BAUER J.1978; ELECTRON. PACKAG. PRODUCT.; U.S.A.; DA. 1978; VOL. 18; NO 5; PP. 87-89Article