Etude hydraulique et thermique de l'ébullitionconvective de fluide R22 dans des canaux de section rectangulaireSaclier, François; Hopfinger, Emil.1989, 210 p.Thesis

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INVERSION DE LA CHARGE DANS LES DISPOSITIFS A COUPLAGE PAR CHARGEAMINEV AM; SULTANOV A KH; TIMOFEEV AL et al.1980; RADIOTEKHNIKA; SUN; DA. 1980; VOL. 35; NO 6; PP. 10-14; BIBL. 5 REF.Article

ANALYSIS OF THE EFFECTIVE TRANSFER LOSSES IN A LOW-LOSS CCDSAUER DJ.1979; R.C.A. REV.; USA; DA. 1979; VOL. 40; NO 3; PP. 278-294; BIBL. 4 REF.Article

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A high performance electrostatic positron beamBRUSA, R. S; KARWASZ, G. P; BETTONTE, M et al.Applied surface science. 1997, Vol 116, pp 59-62, issn 0169-4332Conference Paper

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INTERACTION PROCHE DANS LES FAISCEAUX ELECTRONIQUES INTENSESVARENTSOV VA; MANUILOV VN; TSIMRING SH E et al.1982; IZVESTIJA VYSSIH UCEBNYH ZAVEDENIJ. RADIOFIZIKA; ISSN 0021-3462; SUN; DA. 1982; VOL. 25; NO 11; PP. 1349-1357; ABS. ENG; BIBL. 6 REF.Article

STATIC PROTECTION IN ELECTRONICS MANUFACTURINGBERBECO GR.1980; ELECTRON. PACK. PROD.; ISSN 0013-4945; USA; DA. 1980; VOL. 20; NO 7; PP. 148-157; 6 P.; BIBL. 4 REF.Article

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