Nuclear power in China: the first atomic power station under constructionANDO, Y.Welding International. 1987, Vol 1, Num 10, pp 969-975Article

ITC : international test conference 2002 (Baltimore MD, 7-10 October 2002)Proceedings - International Test Conference. 2002, issn 1089-3539, isbn 0-7803-7542-4, XVI, 1250 p, isbn 0-7803-7542-4Conference Proceedings

Inevitable use of TAP domains in SOCsWHETSEL, Lee.Proceedings - International Test Conference. 2002, issn 1089-3539, isbn 0-7803-7542-4, p. 1191Conference Paper

Neighbor selection for variance reduction in I_DDO and other parametric dataDAASCH, W. Robert; COTA, Kevin; MCNAMES, James et al.Proceedings - International Test Conference. 2002, pp 1240-1248, issn 1089-3539, isbn 0-7803-7542-4, 9 p.Conference Paper

On the accuracy of jitter separation from bit error rate functionLI, Mike P; WILSTRUP, Jan B.Proceedings - International Test Conference. 2002, pp 710-716, issn 1089-3539, isbn 0-7803-7542-4, 7 p.Conference Paper

Improved digital I/O ports enhance testability of interconnectionsKRISTOF, Adam.Proceedings - International Test Conference. 2002, pp 763-772, issn 1089-3539, isbn 0-7803-7542-4, 10 p.Conference Paper

Integrating DFT in the physical synthesis flowGUILLER, L; NEUVEUX, F; DUGGIRALA, S et al.Proceedings - International Test Conference. 2002, pp 788-795, issn 1089-3539, isbn 0-7803-7542-4, 8 p.Conference Paper

Integration of SRAM redundancy into production testJAYABALAN, Jayasanker; POVAZANEC, Juraj.Proceedings - International Test Conference. 2002, pp 187-193, issn 1089-3539, isbn 0-7803-7542-4, 7 p.Conference Paper

Automatic generation of design constraints in verifying high performance embedded dynamic circuitsBHADRA, Jayanta; KRISHNAMURTHY, Narayanan.Proceedings - International Test Conference. 2002, pp 213-222, issn 1089-3539, isbn 0-7803-7542-4, 10 p.Conference Paper

DUT capture using simultaneous logic acquisitionSIVARAM, A. T; FRITZSCHE, William; KOSHI, Toshitaka et al.Proceedings - International Test Conference. 2002, pp 280-289, issn 1089-3539, isbn 0-7803-7542-4, 10 p.Conference Paper

Is ITC bored with board test?BUTLER, Kenneth M.Proceedings - International Test Conference. 2002, issn 1089-3539, isbn 0-7803-7542-4, p. 1237Conference Paper

IEEE P1149.6: A boundary-scan standard for advanced digital networksEKLOW, Bill; BARNHART, Carl F; PARKER, Ken et al.Proceedings - International Test Conference. 2002, pp 1056-1065, issn 1089-3539, isbn 0-7803-7542-4, 10 p.Conference Paper

A structured graphical tool for analyzing Boundary Scan violationsCOGSWELL, Michael; MARDHANI, Shazia; MELOCCO, Kevin et al.Proceedings - International Test Conference. 2002, pp 755-762, issn 1089-3539, isbn 0-7803-7542-4, 8 p.Conference Paper

Charge based transient current Testing (CBT) for submicron CMOS SRAMsALORDA, B; ROSALES, M; SODEN, J et al.Proceedings - International Test Conference. 2002, pp 947-953, issn 1089-3539, isbn 0-7803-7542-4, 7 p.Conference Paper

Multi-purpose digital test core utilizing programmable logicDAVIS, J. S; KEEZER, D. C.Proceedings - International Test Conference. 2002, pp 438-445, issn 1089-3539, isbn 0-7803-7542-4, 8 p.Conference Paper

The consequences of an open ATE architecturePEREZ, Sergio M.Proceedings - International Test Conference. 2002, issn 1089-3539, isbn 0-7803-7542-4, p. 1210Conference Paper

The role of test in a highly outsourced business modelPRICE, Bill.Proceedings - International Test Conference. 2002, issn 1089-3539, isbn 0-7803-7542-4, p. 1214Conference Paper

sting highly integrated wireless circuits and systems with low cost tester: How to overcome the challenge?SLAMANI, Mustapha.Proceedings - International Test Conference. 2002, issn 1089-3539, isbn 0-7803-7542-4, p. 1225Conference Paper

Techniques to reduce data volume and application time for transition testXIAO LIU; HSIAO, Michael; CHAKRAVARTY, Sreejit et al.Proceedings - International Test Conference. 2002, pp 983-992, issn 1089-3539, isbn 0-7803-7542-4, 10 p.Conference Paper

Test and evaluation of multiple embedded mixed-signal test coresHAFED, Mohamed; ROBERTS, Gordon W.Proceedings - International Test Conference. 2002, pp 1022-1030, issn 1089-3539, isbn 0-7803-7542-4, 9 p.Conference Paper

The process and challenges of a high-speed DUT Board projectMCFEELY, David E.Proceedings - International Test Conference. 2002, pp 565-573, issn 1089-3539, isbn 0-7803-7542-4, 9 p.Conference Paper

Verifying properties using sequential ATPGABRAHAM, Jacob A; VEDULA, Vivekananda M; SAAB, Daniel G et al.Proceedings - International Test Conference. 2002, pp 194-202, issn 1089-3539, isbn 0-7803-7542-4, 9 p.Conference Paper

Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithmYU HUANG; MUKHERJEE, Nilanjan; REDDY, Sudhakar M et al.Proceedings - International Test Conference. 2002, pp 74-82, issn 1089-3539, isbn 0-7803-7542-4, 9 p.Conference Paper

Integrated test data decompression and core wrapper design for low-cost system-on-a-chip testingGONCIARI, Paul Theo; AL-HASHIMI, Bashir M; NICOLICI, Nicola et al.Proceedings - International Test Conference. 2002, pp 64-73, issn 1089-3539, isbn 0-7803-7542-4, 10 p.Conference Paper

Efficient embedded memory Testing with APGSIVARAM, A. T; FAN, Daniel; YIIN, A et al.Proceedings - International Test Conference. 2002, pp 47-54, issn 1089-3539, isbn 0-7803-7542-4, 8 p.Conference Paper