DER NEUE TREND IN DER TRANSMISSIONS-ELEKTRONENMIKROSKOPIE: 200 KV STATT 100 KV = LE NOUVEAU MARCHE DANS LA MICROSCOPIE ELECTRONIQUE PAR TRANSMISSION: 200 KV A LA PLACE DE 100 KVWILLIG V.1979; G. I. T., FACHZ. LAB.; DEU; DA. 1979; VOL. 23; NO 1; PP. 40-41Article

NEW APPLICATIONS AND EXTENSIONS OF THE UNIQUE ADVANTAGES OF HVEM FOR PHYSICAL AND MATERIALS RESEARCH.FISHER RM; IMURA T.1978; ULTRAMICROSCOPY; NLD; DA. 1978; VOL. 3; NO 1; PP. 3-18; BIBL. 1 REF.Article

AN IMPROVED SCANNING SYSTEM FOR A HIGH-VOLTAGE ELECTRON MICROSCOPE.STROJNIK A; SPARROW TG.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 5; PP. 502-504; BIBL. 12 REF.Article

NOUVEAU TYPE DE LENTILLE MAGNETIQUE POUR MICROSCOPE ELECTRONIQUE.BALLADORE JL; MURILLO R.1977; J. MICR. SPECTROSC. ELECTRON.; FR.; DA. 1977; VOL. 2; NO 3; PP. 211-222; ABS. ANGL.; BIBL. 11 REF.Article

UN NOUVEAU CRYOSTAT POUR LE MICROSCOPE ELECTRONIQUE SUPRACONDUCTEUR 400 KV.LABERRIGUE A; BALOSSIER G; GENOTEL D et al.1976; REV. PHYS. APPL.; FR.; DA. 1976; VOL. 11; NO 5; PP. 685-687; ABS. ANGL.; BIBL. 3 REF.Article

MECANISME DE FORMATION D'UNE ZONE LIBRE DE PORES DE LACUNES SUR LA SURFACE LORS DE L'IRRADIATION D'UN METAL PAR DES ELECTRONS DANS UN MICROSCOPE ELECTRONIQUE DE HAUTE TENSIONGOLUBOV SI; KONOBEEV YU V; RYABOV VA et al.1981; Z. TEH. FIZ.; ISSN 0044-4642; SUN; DA. 1981; VOL. 51; NO 4; PP. 811-817; BIBL. 11 REF.Article

ON PROSPECTS OF HIGH VOLTAGE MICROWAVE MICROSCOPES.PASSOW C.1976; OPTIK; DTSCH.; DA. 1976; VOL. 46; NO 4; PP. 501-504; ABS. ALLEM.; BIBL. 6 REF.Article

A DIRECT COMPARISON BETWEEN SEM(EBIC) AND HVEM IMAGES OF CRYSTAL DEFECTS IN SEMICONDUCTORS.BLUMTRITT H; GLEICHMANN R.1977; ULTRAMICROSCOPY; NETHERL.; DA. 1977; VOL. 2; NO 4; PP. 405-408; BIBL. 9 REF.Article

DEVELOPMENT OF ELECTRON MICROSCOPY AND ITS FUTUREHASHIMOTO H PREF.1979; J. ELECTRON. MICR.; JPN; DA. 1979; VOL. 28; SUPPL.; PP. S1-S86; BIBL. DISSEM.Conference Paper

ETAT D'AVANCEMENT DES TRAVAUX DE CONSTRUCTION D'UN MICROSCOPE A BALAYAGE EN TRANSMISSION A 1,6 MVJOUFFREY BERNARD; TRINQUIER JACQUES.1981; ; FRA; DA. 1981; DGRST/78 7 3021; 8 P.; 30 CM; ACTION URGENTEReport

CONTRIBUTION A L'ETUDE DES LENTILLES MAGNETIQUES UTILISEES EN MICROSCOPIE ELECTRONIQUE A TRES HAUTE TENSIONMURILLO ROBERT.1978; ; FRA; DA. 1978; 816; 141 P.: ILL.; 29 CM; BIBL. 3 P.; TH.: SCI., OPT. ELECTRON./TOULOUSE 3/1978Thesis

A CONVENTIONAL LENS FOR A 5 MV ELECTRON MICROSCOPE.STROJNIK A; PASSOW C.1978; OPTIK; DTSCH.; DA. 1978; VOL. 50; NO 2; PP. 169-173; ABS. ALLEM.; BIBL. 12 REF.Article

DAS 1000-KILOVOLT-ELEKTRONENMIKROSKOP DER ORGANISATION FUER ANGEWANDTE NATURWISSENSCHAFTLICHE UNTERSUCHUNGEN "TNO" IN APELDOORN, NIEDERLAND. = LE MICROSCOPE ELECTRONIQUE DE 1000 KV DE L'ORGANISATION POUR LES RECHERCHES DANS LES SCIENCES DE LA NATURE TNO A APELDOORN, HOLLANDEZEEDIJK HB; VAN ZUYLEN P.1977; MIKROSKOPIE; OESTERR.; DA. 1977; VOL. 33; NO 5-6; PP. 158-167; ABS. ANGL.; BIBL. 10 REF.Article

A SURVEY OF HIGH-VOLTAGE ELECTRON MICROSCOPE OPERATIONSPARSONS DF; RATKOWSKI AJ.1980; ULTRAMICROSCOPY; NLD; DA. 1980; VOL. 5; NO 2; PP. 209-213; BIBL. 1 REF.Article

A CONSTANT-LOAD TENSILE DEVICE FOR AN ULTRA-HIGH VOLTAGE ELECTRON MICROSCOPE AND ITS APPLICATIONS TO MATERIALS SCIENCE.TABATA T; NAKAJIMA Y; FUJITA H et al.1977; JAP. J. APPL. PHYS.; JAP.; DA. 1977; VOL. 16; NO 11; PP. 2011-2015; BIBL. 16 REF.Article

CAPACITIVE MEASUREMENTS OF SLOW FLUCTUATIONS IN HIGH-VOLTAGE SUPPLIES FOR ELECTRON MICROSCOPES.RUST HP; WEISS K; ZILSKE P et al.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 1; PP. 71-73Article

MINIATURE ROTATION-FREE MAGNETIC ELECTRON LENSES FOR THE ELECTRON MICROSCOPE.JUMA SM; MULVEY T.1978; J. PHYS. E; GBR; DA. 1978; VOL. 11; NO 8; PP. 759-764; BIBL. 12 REF.Article

APPLICATION OF SCANNING TRANSMISSION ELECTRON MICROSCOPY TO SEMICONDUCTOR DEVICES.SPARROW TG; VALDRE U.1977; PHILOS. MAG.; G.B.; DA. 1977; VOL. 36; NO 6; PP. 1517-1528; BIBL. 25 REF.Article

HIGH RESOLUTION ELECTRON MICROSCOPE1979; MEASUR. AND CONTROL; GBR; DA. 1979; VOL. 12; NO 8; PP. 324Article

OPTIMUM CONDITIONS FOR STRAINING EXPERIMENTS IN THE HVEMMARTIN JL; KUBIN LP.1979; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1979; VOL. 56; NO 2; PP. 487-494; ABS. FRE; BIBL. 26 REF.Article

ETUDE DU COMPORTEMENT VIBRATOIRE D'UN MICROSCOPE ELECTRONIQUE A HAUTE TENSION (3,5 MV)MAINY DOMINIQUE.1978; ; FRA; DA. 1978; 612; 209 P.; 30 CM.; BIBL. 67 REF.; TH. DOCT.-ING./TOULOUSE 3/1978Thesis

THE APPLICATION OF A HIGH VOLTAGE SCANNING ELECTRON MICROSCOPE FOR ELECTRON CHANNELLING PATTERN ANALYSISWATANABE E; YAMAMOTO T.1978; J. MATER. SCI.; GBR; DA. 1978; VOL. 13; NO 11; PP. 2519-2523; BIBL. 7 REF.Article

PROCEEDINGS/ELECTRON MICROSCOPY SOCIETY OF AMERICA 37TH ANNUAL MEETING, SAN ANTONIO TX, AUGUST 13-17, 1979 = COMPTE RENDU DE LA 37EME RENCONTRE ANNUELLE DE LA SOCIETE AMERICAINE DE MICROSCOPIE ELECTRONIQUE, SAN ANTONIO TX, 13-17 AOUT 1979BAILEY GW ED.1979; ELECTRON MICROSCOPY SOCIETY OF AMERICA. ANNUAL MEETING. 37/1979-08-13/SAN ANTONIO TX; USA; BATON ROUGE: CLAITOR'S PUBLISHING DIVISION; DA. 1979; (XXIV)-707 P.: ILL.; 26 CM; BIBL. DISSEM.Conference Proceedings

NEUERE BEITRAEGE DER ELEKTRONENMIKROSKOPIE ZUM VERSTAENDNIS VON WERKSTOFFEIGENSCHAFTEN IN METALLEN UND KERAMIKEN = NEW CONTRIBUTIONS TO ELECTRON MICROSCOPY FOR A BETTER UNDERSTANDING OF MATERIALS PROPERTIES IN METALS AND CERAMICSRUEHLE M.1980; RADEX-RUNDSCH.; AUT; DA. 1980-05; VOL. 1/2; PP. 66-75; BIBL. 38 REF.Conference Paper

IMPROVED VOLTAGE MEASUREMENT SYSTEM USING THE SCANNING ELECTRON MICROSCOPE.TEE WJ; GOPINATH A.1977; REV. SCI. INSTRUM.; U.S.A.; DA. 1977; VOL. 48; NO 3; PP. 350-355; BIBL. 5 REF.Article