Bubble-point and dew-point equation for binary refrigerant mixture R22-R142bLIANCHENG TAN; ZHONGYOU ZHAO; YONGHONG DUAN et al.High Temperatures. High Pressures (Print). 1992, Vol 24, Num 4, pp 449-454, issn 0018-1544Conference Paper

Imaging using tip-surface distance variations vs. voltage in scanning tunneling microscopySEINE, G; CORATGER, R; CARLADOUS, A et al.Surface science. 2000, Vol 465, Num 3, pp 219-226, issn 0039-6028Article

Changes in optimal distribution of heat exchanger area between the evaporator and suction gas heat exchanger when replacing R22 with R407CGABRIELII, C; VAMLING, L.International journal of refrigeration. 1998, Vol 21, Num 6, pp 440-451, issn 0140-7007Article

Saturated liquid densities and bubble point pressures of the ternary HCFC-22/HFC-152a/HCFC-142b systemMAEZAWA, Y; WIDIATMO, J. V; SATO, H et al.Fluid phase equilibria. 1991, Vol 67, pp 203-212, issn 0378-3812Article

The effects of varying composition on heat transfer in the critical region of binary fluid mixturesHERNANDEZ, S; MARSCHALL, E.International communications in heat and mass transfer. 1989, Vol 16, Num 2, pp 305-314, issn 0735-1933Article

Frictional performance of R-22 and R-410A inside a 5.0 mm wavy diameter tubeWANG, Chi-Chung; ING YOUN CHEN; SHYU, Horng-Jye et al.International journal of heat and mass transfer. 2003, Vol 46, Num 4, pp 755-760, issn 0017-9310, 6 p.Article

Characterization of surface composition on Alloy 22 in neutral chloride solutionsZAGIDULIN, Dmitrij; XIANGRONG ZHANG; JIGANG ZHOU et al.Surface and interface analysis. 2013, Vol 45, Num 6, pp 1014-1019, issn 0142-2421, 6 p.Article

Saturated liquid densities and dubble-point pressures of the binary HCFC 22 + HFC 152a systemMAEZAWA, Y; SATO, H; WATANABE, K et al.Fluid phase equilibria. 1991, Vol 61, Num 3, pp 263-273, issn 0378-3812, 11 p.Article

Measurements of the PVTx properties of binary refrigerant R 12+R 22 system (second report: PVTx state-surface and composition dependence of the thermodynamic properties)TAKAISHI, Y; KAGAWA, N; UEMATSU, M et al.Bulletin of the JSME. 1984, Vol 27, Num 230, pp 1696-1701, issn 0021-3764Article

Force measurements on hydrophobized silica surfaces by using AFMHÜTTL, G; HEGER, K; KLEMM, V et al.Fresenius' journal of analytical chemistry. 1999, Vol 363, Num 2, pp 206-208, issn 0937-0633Article

Imaging magnetic charges with magnetic force microscopyHUBERT, A; RAVE, W; TOMLINSON, S. L et al.Physica status solidi. B. Basic research. 1997, Vol 204, Num 2, pp 817-828, issn 0370-1972Article

Energy dissipation rate of a sample-induced thermal fluctuating field in the tip of a probe microscopeDOROFEYEV, I. A.Journal of physics. D, Applied physics (Print). 1998, Vol 31, Num 6, pp 600-601, issn 0022-3727Article

New AFM imaging for observing a high aspect structureHOSAKA, Sumio; MORIMOTO, Takafumi; KURODA, Hiroshi et al.Applied surface science. 2002, Vol 188, Num 3-4, pp 467-473, issn 0169-4332Conference Paper

Nanoscale modification of conducting lines with a scanning force microscopeRANK, R; BRÜCKL, H; KRETZ, J et al.Vacuum. 1997, Vol 48, Num 5, pp 467-472, issn 0042-207XArticle

Scanning tunneling microscopy fabrication of an Si atom chainHUANG, D. H; AONO, M.Surface science. 1997, Vol 386, Num 1-3, pp 166-168, issn 0039-6028Conference Paper

A matrix method for treating the coupling between an electron and a surface plasmon : a dynamical image potential in model tunnelling junctionsNESS, H; FISHER, A. J.Journal of physics. Condensed matter (Print). 1998, Vol 10, Num 17, pp 3697-3718, issn 0953-8984Article

Force-distance curves by atomic force microscopyCAPPELLA, B; DIETLER, G.Surface science reports. 1999, Vol 34, Num 1-3, pp 1-104, issn 0167-5729Article

Layer-by-layer atomic manipulation on Si(111)-7 x 7 surface : surface structures and staircase conductance variation with atom removalKOMEDA, T; HASUNUMA, R; MUKAIDA, H et al.Surface science. 1997, Vol 386, Num 1-3, pp 149-153, issn 0039-6028Conference Paper

Constraining new forces in the casimir regime using the isoelectronic techniqueDECCA, R. S; LOPEZ, D; CHAN, H. B et al.Physical review letters. 2005, Vol 94, Num 24, pp 240401.1-240401.4, issn 0031-9007Article

Tip-induced surface polarization : a new mechanism for contrast in the scanning tunnelling microscopeNESS, H; FISHER, A. J; BRIGGS, G. A. D et al.Surface science. 1997, Vol 380, Num 1, pp L479-L484, issn 0039-6028Article

Tip-induced nanostructuring of alloy surfaces with an electrochemical scanning tunneling microscopeMAUPAI, S; DAKKOURI, A. S; SCHMUKI, P et al.Surface science. 2005, Vol 597, Num 1-3, pp 20-25, issn 0039-6028, 6 p.Conference Paper

Fabrication of a nano-magnet on a piezo-driven tip in a TEM sample holderTAKEGUCHI, M; SHIMOJO, M; CHE, R et al.Journal of materials science. 2006, Vol 41, Num 9, pp 2627-2630, issn 0022-2461, 4 p.Article

Quantum coherence effects in the scanning tunneling microscope : a simple interpretation of contact resistance experimentsBISCARINI, F; KENKRE, V. M.Surface science. 1999, Vol 426, Num 3, pp 336-344, issn 0039-6028Article

Interaction measurements between a tip and a sample in proximity regions controlled by tunneling current in a UHV STM-AFMARAI, T; TOMITORI, M.Applied surface science. 1999, Vol 144-45, pp 501-504, issn 0169-4332Conference Paper

Tip-surface interactions at redox responsive poly(ferrocenylsilane) (PFS) interface by AFM-based force spectroscopyHONG JING CHUNG; JING SONG; VANCSO, G. Julius et al.Applied surface science. 2009, Vol 255, Num 15, pp 6995-6998, issn 0169-4332, 4 p.Article