Proceedings of the European Microbeam Analysis Society (EMAS)VAN'T DACK, L; GIJBELS, R; WALKER, C. T et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, issn 0026-3672, 201 p.Conference Proceedings

Modern Developments and Application in Microbeam Analysis. Proceedings of the 8th Workshop of the European Microbeam Analysis Society (EMAS), Chiclana de la Frontera, Spain, May 18-22, 2003. Part 2LLOVET, X; SALVAT, F; WALKER, C. T et al.Mikrochimica acta (1966. Print). 2004, Vol 147, Num 3, issn 0026-3672, 63 p.Conference Proceedings

Modern Developments and Applications in Microbeam Analysis, Proceedings of the 7th Workshop of the European Microbeam Analysis Society (EMAS), May 6-10, 2001, Tampere, FinlandHEIKINHEIMO, Erkki; WALKER, Clive Thomas; ARMIGLIATO, Aldo et al.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, issn 0026-3672, 190 p.Conference Proceedings

Applications of microanalysis in the cultural heritage fieldJOOSTEN, Ineke.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 295-299, issn 0026-3672, 5 p.Conference Paper

First X-ray fluorescence excited Kossel diffraction in SEMLANGER, Enrico; HASCHKE, Michael; DÄBRITZ, Siegfried et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 455-458, issn 0026-3672, 4 p.Conference Paper

Virtual standard for wavelength-dispersive electron-probe microanalysisMERLET, Claude; LLOVET, Xavier; DUGNE, Olivier et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 427-432, issn 0026-3672, 6 p.Conference Paper

Monte Carlo calculations in X-ray microanalysis of epitaxial layersPOPOVA, Tatiana B; FLEGONTOVA, Ekaterina Yu; BAKALEINIKOV, Leonid A et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 459-463, issn 0026-3672, 5 p.Conference Paper

New model ultra-soft X-ray spectrometer for microanalysisFUKUSHIMA, Sei; KIMURA, Takashi; OGIWARA, Toshiya et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 399-404, issn 0026-3672, 6 p.Conference Paper

SIMS analysis of chlorine in metasomatised upper-mantle rocksOTTOLINI, Luisa P; LE FEVRE, Brieuc.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 329-336, issn 0026-3672, 8 p.Conference Paper

Application of EPMA and analytical TEM to brazed metal-supported catalytic convertersRICHTER, Silvia; BODE, Hans; DIMYATI, Arbi et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 405-411, issn 0026-3672, 7 p.Conference Paper

Soluble fraction of stabilising elements in ferritic stainless steelALMAGRO, Juan F; LLOVET, Xavier; AUXILIADORA HEREDIA, M et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 323-327, issn 0026-3672, 5 p.Conference Paper

A SIMS study of lithium, boron and chlorine in basalts from Reykjanes (southwestern Iceland)RAFFONE, Nicola; OTTOLINI, Luisa; TONARINI, Sonia et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 307-312, issn 0026-3672, 6 p.Conference Paper

Application of EPMA and XRF for the investigation of particulate pollutants in the field of cultural heritageKONTOZOVA-DEUTSCH, Velichka; DEUTSCH, Felix; GODOI, Ricardo H. M et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 465-469, issn 0026-3672, 5 p.Conference Paper

Applications of focused ion beam SIMS in materials scienceMCPHAIL, David S; CHATER, Richard J; LIBING LI et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 387-397, issn 0026-3672, 11 p.Conference Paper

Investigation of InxGa1-xN layers by local methodsDOMRACHEVA, Yana V; BAKALEINIKOV, Leonid A; FLEGONTOVA, Ekaterina Yu et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 371-375, issn 0026-3672, 5 p.Conference Paper

Advanced X-ray laboratory microbeam techniques applied to metallurgyGELFI, Marcello; BONTEMPI, Elza; CORNACCHIA, Giovanna et al.Mikrochimica acta (1966. Print). 2006, Vol 155, Num 1-2, pp 151-155, issn 0026-3672, 5 p.Conference Paper

EPMA present and futureLOVE, Glyn.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 115-124, issn 0026-3672Conference Paper

Benefits of X-ray spectrum simulation at low energiesDUNCUMB, Peter; STATHAM, Peter J.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 249-258, issn 0026-3672Conference Paper

Quantitative high resolution electron microscopyVAN DYCK, D.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 153-180, issn 0026-3672Conference Paper

Nanometer-scale chemical surface analysis by scanning (tunnelling) atom probesALKEMADE, Paul F. A; GRIBOV, Nicolai N.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 195-206, issn 0026-3672Conference Paper

Examples of quantification in XPS on 5f materialsGOUDER, Thomas; HAVELA, Ladislav.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 207-215, issn 0026-3672Conference Paper

Structural and chemical analysis of materials with high spatial resolutionVAN BENTHEM, Klaus; KRÄMER, Stephan; SIGLE, Wilfried et al.Mikrochimica acta (1966. Print). 2002, Vol 138, Num 3-4, pp 181-193, issn 0026-3672Conference Paper

EDX-spectra simulation in electron probe microanalysis. Optimization of excitation conditions and detection limitsEGGERT, Frank.Mikrochimica acta (1966. Print). 2006, Vol 155, Num 1-2, pp 129-136, issn 0026-3672, 8 p.Conference Paper

Low voltage contrast with an SEM transmission electron detectorGRILLON, Francois.Mikrochimica acta (1966. Print). 2006, Vol 155, Num 1-2, pp 157-161, issn 0026-3672, 5 p.Conference Paper

Influence of second-order lines on the quantitative wavelength dispersive spectrometry analysis at low accelerating voltagesMIKLI, Valdek.Mikrochimica acta (1966. Print). 2006, Vol 155, Num 1-2, pp 205-208, issn 0026-3672, 4 p.Conference Paper