2C or not 2C?GUIVARCH, Céline; HALLEGATTE, Stéphane.Global environmental change. 2013, Vol 23, Num 1, pp 179-192, issn 0959-3780, 14 p.Article

Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMSSEAH, M. P; GILMORE, I. S.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 228-235, issn 0142-2421, 8 p.Conference Paper

The use of low-energy SIMS (LE-SIMS) for nanoscale fuel cell material developmentMORRIS, R. J. H; FEARN, S; PERKINS, J et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 635-638, issn 0142-2421, 4 p.Conference Paper

ZnO nanoparticles enhancing secondary ion signals of Escherichia coli analyzed by ToF-SIMSLEI, Shiou-Ling; YIN, Yu-Sheng; LEE, Pei-Ling et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 310-312, issn 0142-2421, 3 p.Conference Paper

Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMSNITTLER, L; DELCORTE, A; BERTRAND, P et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 103-106, issn 0142-2421, 4 p.Conference Paper

ToF-SIMS depth profiling of vitamin C layers using Cs⁺ and Xe⁺ ion beamsWEHBE, Nimer; HOUSSIAU, Laurent.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 190-193, issn 0142-2421, 4 p.Conference Paper

Comparison of MeV monomer ion and keV cluster ToF-SIMSJONES, Brian N; MATSUO, Jiro; NAKATA, Yoshihiko et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 249-252, issn 0142-2421, 4 p.Conference Paper

A beneficial application of backside SIMS for the depth profiling characterization of implanted siliconFUJIYAMA, N; HASEGAWA, T; SUDA, T et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 654-656, issn 0142-2421, 3 p.Conference Paper

A new time-of-flight SIMS instrument for 3D imaging and analysisHILL, Rowland; BLENKINSOPP, Paul; THOMPSON, Stephen et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 506-509, issn 0142-2421, 4 p.Conference Paper

Analysis of organic multilayered samples for optoelectronic devices by (low-energy) dynamic SIMSNGO, K. Q; PHILIPP, P; JIN, Y et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 194-197, issn 0142-2421, 4 p.Conference Paper

Development of an energy-resolved method for SIMS in-depth analysis of metal-polymer interfacesTELLEZ, Helena; VADILLO, José M; LASERNA, J. Javier et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 632-634, issn 0142-2421, 3 p.Conference Paper

Identification and Imaging of ¹⁵N labeled cells with ToF-SIMSTYLER, Bonnie J; TAKENO, Marc M; HAUCH, Kip D et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 336-339, issn 0142-2421, 4 p.Conference Paper

Proposed ToF-SIMS/XPS standardization methods for bonding wires in electronic packaging applicationsSODHI, R; GALLAUGHER, M; WANG, Z et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 586-590, issn 0142-2421, 5 p.Conference Paper

Routine TOF-SIMS instrument control using polycarbonate materialFARTMANN, Michael; KERSTING, Reinhard; HAGENHOFF, Birgit et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 417-419, issn 0142-2421, 3 p.Conference Paper

Useful yields of organic molecules under dynamic SIMS cluster bombardmentGILLEN, Greg; SZAKAL, Christopher; BREWER, Tim M et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 376-379, issn 0142-2421, 4 p.Conference Paper

Developing ToF-SIMS methods for investigating the degradation of plastic debris on beachesBIESINGER, Mark C; CORCORAN, Patricia L; WALZAK, Mary Jane et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 443-445, issn 0142-2421, 3 p.Conference Paper

Investigation of fullerene depth distribution in PMMA-C₆₀ blends using dual beam ToF-SIMSPY, M; BARNES, J. P; CHARBONNEAU, M et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 179-182, issn 0142-2421, 4 p.Conference Paper

MeV-energy probe SIMS imaging of major components in washed and fractured animal cellsYAMADA, H; NAKATA, Y; NINOMIYA, S et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 363-366, issn 0142-2421, 4 p.Conference Paper

The cuticular surface of D. melanogaster: ToF-SIMS on the flyLEVINE, J; BILLETER, J.-C; KRULL, U et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 317-321, issn 0142-2421, 5 p.Conference Paper

Three-dimensional reconstruction of a nickel-alumina composite coating by FIB-SIMSCHATER, Richard J; CORNI, Ilaria; BOCCACCINI, Aldo R et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 492-494, issn 0142-2421, 3 p.Conference Paper

ToF-SIMS imaging of surface self-organized fractal patterns of bacteriaTUCCITTO, N; MARLETTA, G; CARNAZZA, S et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 370-375, issn 0142-2421, 6 p.Conference Paper

Advanced SIMS quantification in the first few nm of B, P and As ultrashallow implantsMERKULOV, A; PERES, P; CHOI, S et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 522-524, issn 0142-2421, 3 p.Conference Paper

C₆₀ molecular depth profiling of bilayered polymer films using ToF-SIMSMOUHIB, T; DELCORTE, A; POLEUNIS, C et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 175-178, issn 0142-2421, 4 p.Conference Paper

Chemical depth profiling of copper oxide film by ToF-SIMS using Bi₃⁺⁺ clusterMASUDOME, Harumi; ABE, Hiroko.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 664-668, issn 0142-2421, 5 p.Conference Paper

Cold plasma cleaning of copper and aluminum tested by SIMS depth profile analysisKONARSKI, P; OPALINSKA, T.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 612-617, issn 0142-2421, 6 p.Conference Paper