Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:(%22TRANSITION METAL ISOLANT%22)

Filter

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 1021521

  • Page / 40861
Export

Selection :

  • and

MATRICE PHOTODETECTRICE A BASE DE STRUCTURES: METAL-DIELECTRIQUE-METAL-DIELECTRIQUE-METALKOVTONYUK NF; MOROZOV VA; RUKAVISHNIKOV VA et al.1973; MIKROELEKTRONIKA; S.S.S.R.; DA. 1973; VOL. 2; NO 1; PP. 57-59; BIBL. 4 REF.Serial Issue

ELECTROLUMINESCENCE FROM MIS AND MIM STRUCTURESWOODCOCK JM; RALPH JE.1972; J. NON-CRYST. SOLIDS; NETHERL.; DA. 1972; VOL. 11; NO 1; PP. 83-96; BIBL. 10 REF.Serial Issue

A METHOD OF INVESTIGATION OF HOT ELECTRON TRANSPORT THROUGH THIN METAL FILMS USING THE METAL-BASE TRIODE CONFIGURATIONANTULA J.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 13; NO 1; PP. 93-97; BIBL. 14 REF.Serial Issue

EXPERIMENTAL OBSERVATION OF SWITCHING IN MISM AND MISIM DEVICESDARWISH M; BOARD K.1981; IEE PROC., I; ISSN 0143-7100; GBR; DA. 1981; VOL. 128; NO 5; PP. 161-164; BIBL. 7 REF.Article

THEORY OF SWITCHING IN MISIM STRUCTURESDARWISH M; BOARD K.1981; IEE PROC., I; ISSN 0143-7100; GBR; DA. 1981; VOL. 128; NO 5; PP. 165-173; BIBL. 13 REF.Article

EFFET D'ECRAN VIS-A-VIS DU CHAMP ELECTRIQUE DANS LES CRISTAUX ISOLES. CINETIQUE D'ECRANGORBACHEV VV; GOKHFEL'D YU I.1972; IZVEST. VYSSH. UCHEBN. ZAVED., FIZ.; S.S.S.R.; DA. 1972; VOL. 15; NO 6; PP. 101-105; BIBL. 10 REF.Serial Issue

INFLUENCE OF THE PROPERTIES OF THE MATERIALS ON JUNCTION TUNNELLING CHARACTERISTICSBURRAFATO G; FARACI G; GIAQUINTA G et al.1972; J. PHYS. C; G.B.; DA. 1972; VOL. 5; NO 16; PP. 2179-2191; BIBL. 14 REF.Serial Issue

NEGATIVE RESISTANCE IN ORGANIC MONOMOLECULAR LAYERS: EXPERIMENTS ON TRIODESGUNDLACH KH; KADLEC J.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 13; NO 2; PP. 225-230; BIBL. 4 REF.Serial Issue

ELECTRIFICATION BY CONTACT CHARGE EXCHANGE. A LITERATURE SURVEY OF MICROSCOPIC MODELS.GALLO CF; AHUJA SK.1977; I.E.E.E. TRANS. INDUSTRY APPL.; U.S.A.; DA. 1977; VOL. 13; NO 4; PP. 348-355; BIBL. 45 REF.Article

ETUDE DES SYSTEMES METAL-DIELECTRIQUE-SEMICONDUCTEUR A DOUBLE COUCHE DE DIELECTRIQUECOLOMBIER M; JUND C; KERVELLA B et al.1972; DGRST-71 7 2669; FR.; DA. 1972; PP. 1-69; H.T. 38; BIBL. 1 P.; (RAPP. FINAL, ACTION CONCERTEE: PHYS. ELECTRON.)Report

CONTACT ELECTRIFICATIONLOWELL J; ROSE INNES AC.1980; ADV. PHYS.; ISSN 0001-8732; GBR; DA. 1980; VOL. 29; NO 6; PP. 947-1023; BIBL. 191 REF.Article

TRANSIENT PHENOMENA AND THEIR EFFECT ON THE INSULATOR BARRIER IN AL-(AL-OXIDE)-AL STRUCTURES: T=100OKKADLEC J; GUNDLACH KH.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 11; NO 2; PP. 423-437; BIBL. 28 REF.Serial Issue

TUNNELING RESULTS WITH NI DOPED ELECTRODES PREPARED AT 80 KEL SEMARY MA; KAAHWA Y; ROGERS JS et al.1973; SOLID STATE COMMUNIC.; G.B.; DA. 1973; VOL. 12; NO 7; PP. 593-595; ABS. ALLEM.; BIBL. 9 REF.Serial Issue

CONDUCTANCE REDUCTION IN AL-I-AL JUNCTIONS DOPED WITH FE IMPURITIESEL SEMARY MA; ROGERS JS.1972; PHYS. LETTERS, A; NETHERL.; DA. 1972; VOL. 42; NO 1; PP. 79-80; BIBL. 10 REF.Serial Issue

QUELQUES PROBLEMES PHYSIQUES ET PRATIQUES ACTUELS DANS LES SYSTEMES SEMICONDUCTEUR-DIELECTRIQUELITOVCHENKO VG.1972; POLUPROVODN. TEKH. MIKROELEKTRON., U.S.S.R.; S.S.S.R.; DA. 1972; NO 8; PP. 3-14; BIBL. 45 REF.Serial Issue

ELECTROLUMINESCENCE FROM CADMIUM SULPHIDE MS, MIS AND SIS DEVICESWHEELER DJ; HANEMAN D.1973; SOLID-STATE ELECTRON.; G.B.; DA. 1973; VOL. 16; NO 8; PP. 875-882; H.T. 3; BIBL. 31 REF.Serial Issue

CHARGE EFFECTS IN THIN FILM ADHESIONGRAF VON HARRACH H; CHAPMAN BN.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 13; NO 1; PP. 157-161; BIBL. 15 REF.Serial Issue

TUNNELING TO TRAPS IN INSULATORSLUNDSTROM I; SVENSSON C.1972; J. APPL. PHYS.; U.S.A.; DA. 1972; VOL. 43; NO 12; PP. 5045-5047; BIBL. 10 REF.Serial Issue

EFFET PHOTOELECTRIQUE DE VARACTOR DES STRUCTURES METAL-DIELECTRIQUE-SEMICONDUCTEUR-DIELECTRIQUE-METALKOVTONYUK NF; MOROZOV VA; ABRAMOV AA et al.1973; RADIOTEKH. I ELEKTRON.; S.S.S.R.; DA. 1973; VOL. 18; NO 5; PP. 1019-1023; BIBL. 7 REF.Serial Issue

ETUDE PAR PHOTOCONDUCTIVITE DES INTERFACES SILICIUM-SILICE ET SILICE-AUTRE ISOLANTBARRUEL F; PFISTER JC.1972; DGRST-71 7 2604; FR.; DA. 1972; PP. 1-28; H.T. 11; ABS. ANGL.; BIBL. 26 REF.; (RAPP. FINAL, ACTION CONCENTREE: PHYS. ELECTRON.)Report

AC ELECTRICAL PROPERTIES AND I-V CHARACTERISTICS OF MOO3 FILM UNDER DC BIASNADKARNI GS; SIMMONS JG.1972; J. APPL. PHYS.; U.S.A.; DA. 1972; VOL. 43; NO 9; PP. 3741-3747; BIBL. 7 REF.Serial Issue

ETUDE DU MOUVEMENT DES CHARGES ELECTRIQUES A LA SURFACE DE L'ISOLANT D'UNE STRUCTURE M.I.S. OU M.I.MHESTO P.1972; ; S.L.; DA. 1972; PP. (54 P.); H.T. 35; BIBL. 2 P.; (THESE DOCT. 3EME CYCLE, SPEC. ELECTRON.; UNIV. PARIS-SUD; 1972)Thesis

CHARACTERISTICS OF METAL-INSULATOR-METAL POINT-CONTACT DIODES USED FOR TWO-LASER MIXING AND DIRECT FREQUENCY MEASUREMENTSBRADLEY CC; EDWARDS GJ.1973; I.E.E.E. J. QUANTUM ELECTRON.; U.S.A.; DA. 1973; VOL. 9; NO 5; PP. 548-549; BIBL. 7 REF.Serial Issue

BREVET AGENT D'ISOLATION THERMIQUE POUR METAUX FONDUS1978; ; FRA; DA. 1978-09-22; FR/A1/2.377.985; DEP.77 01899/1977-01-24Patent

THEORY OF ZERO BIAS ANOMALIES DUE TO PARAMAGNETIC IMPURITIESGUPTA HM.1973; J. PHYS. C; G.B.; DA. 1973; VOL. 6; NO 4; PP. 686-698; BIBL. 24 REF.Serial Issue

  • Page / 40861