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INSPECTION - FACING THE CHALLENGE = LAENGENMESSUNG MIT LASER-INTERFEROMETERN = MESURE DES LONGUEURS PAR INTERFEROMETRE AU LASERCARDEW T.1982; ENGINEERING (LOND.); GBR; DA. 1982-02; VOL. 222; NO 2; PP. 88-89; BIBL. 4 REF.Article

A Southern African positron beamBRITTON, D. T; HÄRTING, M; TEEMANE, M. R. B et al.Applied surface science. 1997, Vol 116, pp 53-58, issn 0169-4332Conference Paper

SUR LA POSSIBILITE DE CHANGER LA VALEUR DE LA BANDE INTERFERENTIELLE DANS UN INTERFEROMETRE A 2 FAISCEAUXSERGEEV VP.1977; OPT.-MEKH. PROMYSHL.; S.S.S.R.; DA. 1977; VOL. 44; NO 2; PP. 53-54; BIBL. 3 REF.Article

FIBER-OPTICAL INTERFEROMETER.SIMON A; ULRICH R.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 2; PP. 77-79; BIBL. 6 REF.Article

LIQUID CRYSTAL WEDGE AS A POLARIZING ELEMENT AND ITS USE IN SHEARING INTERFEROMETRYMURTY MVRK; SHUKLA RP.1980; OPT. ENGNG; USA; DA. 1980; VOL. 19; NO 1; PP. 113-115; BIBL. 6 REF.Article

TWO-WAVE INTERFEROMETERS FOR USE WITH A MONOCHROMATIC SOURCEBASILE G.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 4; PP. 422; BIBL. 1 REF.Article

SUR LA FORMATION D'UNE FIGURE INTERFERENTIELLE PAR DES INTERFEROMETRES A 2 FAISCEAUXSHUKHTIN AM; FEDOTOV GA; MISHAKOV VG et al.1979; OPT. I SPEKTROSK.; SUN; DA. 1979; VOL. 46; NO 6; PP. 1183-1188; BIBL. 2 REF.Article

JOSEPHSON EDGE-JUNCTION DEVICES USING E-BEAM LITHOGRAPHYVETTIGER P; MOORE DF; FORSTER T et al.1981; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1981; VOL. 28; NO 11; PP. 1385-1393; BIBL. 27 REF.Article

NIOBIUM NANOBRIDGE DC SQUIDVOSS RF; LAIBOWITZ RB; BROERS AN et al.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 37; NO 7; PP. 656-658; BIBL. 11 REF.Article

PHENOMENES DE DIFFRACTION DANS UN INTERFEROMETRE LASER A 2 FAISCEAUXLYUBIMOV VV; SHUR VL; EHTSIN I SH et al.1978; OPT. I SPEKTROSK.; SUN; DA. 1978; VOL. 45; NO 2; PP. 368-373; BIBL. 8 REF.Article

LASER BEAM DIVERGENCE IN SHORT INTERFEROMETERS.RADCLIFFE WS.1976; OPT. ENGNG; U.S.A.; DA. 1976; VOL. 15; NO 5; PP. 478; BIBL. 2 REF.Article

NOUVEAU PRISME SEPARATEUR POUR INTERFEROMETREKARTASHEV AI; NESSLER TA; EHTSIN I SH et al.1976; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1976; NO 4; PP. 203-206; BIBL. 2 REF.Article

METHODE DE DETERMINATION DES FAIBLES DEPLACEMENTS DES FRONTS D'ONDES SPHERIQUES DANS LES INTERFEROMETRES A MIROIRS A 2 FAISCEAUXGRIGOR'EV VA; SHEKHTMAN VN.1980; OPT.-MEKH. PROMYSHL.; SUN; DA. 1980; NO 6; PP. 36-38; BIBL. 3 REF.Article

FONCTION D'APPAREIL D'UN INTERFEROMETRE DE FABRY-PEROT ECLAIRE PAR UN FAISCEAU LUMINEUX GAUSSIENNAJDENOV AS; EHTSIN I SH.1979; OPT. I SPEKTROSK.; SUN; DA. 1979; VOL. 46; NO 4; PP. 731-737; BIBL. 6 REF.Article

QUELQUES PARTICULARITES D'UNE FIGURE INTERFERENTIELLE AVEC UNE BANDE ACHROMATIQUE.CHAJKA MO; KOZLOV YU G.1978; OPT.-MEKH. PROMYSHL.; SUN; DA. 1978; NO 6; PP. 7-9; BIBL. 3 REF.Article

A several tens-keV monoenergetic positron surface analyzer with 22Na and electrostatic fieldsNUNOGAKI, M; YAMAMOTO, T; HONDA, Y et al.Applied surface science. 1995, Vol 85, pp 132-137, issn 0169-4332Conference Paper

Installation of a Kr moderator in the high-brightness beam at BrandeisVASUMATHI, D; AMARENDRA, G; CANTER, K. F et al.Applied surface science. 1995, Vol 85, pp 154-157, issn 0169-4332Conference Paper

Polarization mixing error reduction in a two-beam interferometerBITOU, Youichi.Optical review. 2002, Vol 9, Num 5, pp 227-229, issn 1340-6000, 3 p.Article

A high performance electrostatic positron beamBRUSA, R. S; KARWASZ, G. P; BETTONTE, M et al.Applied surface science. 1997, Vol 116, pp 59-62, issn 0169-4332Conference Paper

Half-aperture shearing interferometer for collimation testingYUN WOO LEE; HYUN MO CHO; IN WON LEE et al.Optical engineering (Bellingham. Print). 1993, Vol 32, Num 11, pp 2837-2840, issn 0091-3286Article

Deflection of atoms by circulary polarized light beams in triple laue configurationMARTE, M. M; CIRAC, J. I; ZOLLER, P et al.Journal of modern optics (Print). 1991, Vol 38, Num 11, pp 2265-2280, issn 0950-0340Article

Zone-plate radial-shear interferometers. A study of possible configurationsSMARTT, R. N; HARIHARAN, P.Optica acta. 1985, Vol 32, Num 12, pp 1475-1478, issn 0030-3909Article

Michelson interferometer with beam divider and compensating plate having slight wedge anglesMURTY, M. V. R. K; SHUKLA, R. P.Optical engineering (Bellingham. Print). 1983, Vol 22, Num 5, pp 615-618, issn 0091-3286Article

The measurement of wear in dental restorations using laser dual-source contouring = Verschleissmessung an Zahnersatz durch Konturbestimmung mit dualen LaserquellenATKINSON, J.T.Wear. 1982, Vol 76, Num 1, pp 91-104, issn 0043-1648Article

Nonlinear photographic recording of double-beam interference patternsSKOKOV, I.V; NOSKOV, M.F.Zavodskaâ laboratoriâ. 1984, Vol 50, Num 1, pp 32-36, issn 0321-4265Article

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