2-in-1 red-/green-/blue sensitive a-SiC:H/a-Si:H/a-SiGeC:H thin film photo detector with an integrated optical filterBABLICH, A; MERFORT, C; SCHÄFER-EBERWEIN, H et al.Thin solid films. 2014, Vol 552, pp 212-217, issn 0040-6090, 6 p.Article

A freeze-dried graphene counter electrode enhances the performance of dye-sensitized solar cellsHUNG, Kai-Hsiang; WANG, Hong-Wen.Thin solid films. 2014, Vol 550, pp 515-520, issn 0040-6090, 6 p.Article

A highly reactive photobase catalytic system for sol-gel polymerizationCHEMTOB, Abraham; DE PAZ-SIMON, Héloïse; DIETLIN, Céline et al.Thin solid films. 2014, Vol 550, pp 177-183, issn 0040-6090, 7 p.Article

A numerical simulation study of CuInS₂ solar cellsXUNZHONG SHANG; ZHIQIANG WANG; MINGKAI LI et al.Thin solid films. 2014, Vol 550, pp 649-653, issn 0040-6090, 5 p.Article

Abnormal effect of substrate temperature on perpendicular magnetic anisotropy in sputter-deposited NdFeCo films on silicon substratesLIUNIU TONG; PENG DENG; HE, Xian-Mei et al.Thin solid films. 2014, Vol 562, pp 543-548, issn 0040-6090, 6 p.Article

Al₂O₃/TiO₂ multilayer thin films grown by plasma enhanced atomic layer deposition for organic light-emitting diode passivationHAN, Dong-Suk; CHOI, Duck-Kyun; PARK, Jong-Wan et al.Thin solid films. 2014, Vol 552, pp 155-158, issn 0040-6090, 4 p.Article

Amorphous indium tin oxide films deposited on flexible substrates by facing target sputtering at room temperatureYU XIAO; FANGYUAN GAO; GUOBO DONG et al.Thin solid films. 2014, Vol 556, pp 155-159, issn 0040-6090, 5 p.Article

Atomic layer deposition of copper nitride film and its application to copper seed layer for electrodepositionPARK, Jae-Min; KWANGSEON JIN; BYEOL HAN et al.Thin solid films. 2014, Vol 556, pp 434-439, issn 0040-6090, 6 p.Article

Calculation of dispersion of surface and interface phonon polariton resonances in wurtzite semiconductor multilayer system taking damping effects into accountLEE, S. C; NG, S. S; ABU HASSAN, H et al.Thin solid films. 2014, Vol 551, pp 114-119, issn 0040-6090, 6 p.Article

Characterization of 6,13-bis(triisopropylsilylethynyl) pentacene organic thin film transistors fabricated using pattern-induced confined structureKYOHYEOK KIM; NAMYONG KWON; ILSUB CHUNG et al.Thin solid films. 2014, Vol 550, pp 689-695, issn 0040-6090, 7 p.Article

Characterization of complex inter-layer dielectric stack by spectroscopic ellipsometry: A simple method to reduce parameters correlationsLIKHACHEV, D. V.Thin solid films. 2014, Vol 550, pp 305-311, issn 0040-6090, 7 p.Article

Characterization of poly- and single-crystal uranium-molybdenum alloy thin filmsADAMSKA, A. M; SPRINGELL, R; SCOTT, T. B et al.Thin solid films. 2014, Vol 550, pp 319-325, issn 0040-6090, 7 p.Article

Characterization of subnanometric layers by grazing incidence X-ray reflectometryEMPRIN, B; TROUSSEL, Ph; SOULLIE, G et al.Thin solid films. 2014, Vol 556, pp 54-60, issn 0040-6090, 7 p.Article

Charge carrier transport mechanisms in nanocrystalline indium oxideFORSH, E. A; MARIKUTSA, A. V; MARTYSHOV, M. N et al.Thin solid films. 2014, Vol 558, pp 320-325, issn 0040-6090, 6 p.Article

Chemical vapor deposition of ruthenium-phosphorus alloy thin films: Using phosphine as the phosphorus sourceBOST, Daniel E; EKERDT, John G.Thin solid films. 2014, Vol 558, pp 160-164, issn 0040-6090, 5 p.Article

Comparison of atom probe compositional fidelity across thin film interfacesBRONS, J. G; HERZING, A. A; HENRY, K. T et al.Thin solid films. 2014, Vol 551, pp 61-67, issn 0040-6090, 7 p.Article

Comparison of the structural properties and residual stress of AlN films deposited by dc magnetron sputtering and high power impulse magnetron sputtering at different working pressuresAIT AISSA, K; ACHOUR, A; CAMUS, J et al.Thin solid films. 2014, Vol 550, pp 264-267, issn 0040-6090, 4 p.Article

Composition variations in Cu₂ZnSnSe₄ thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopyDAHYUN NAM; OPANASYUK, A. S; KOVAL, P. V et al.Thin solid films. 2014, Vol 562, pp 109-113, issn 0040-6090, 5 p.Article

Control of molecular orientation and morphology in organic bilayer solar cells: Copper phthalocyanine on gold nanodotsSASAKI, Takayuki; TABATA, Kenichi; TSUKAGOSHI, Kazuhito et al.Thin solid films. 2014, Vol 562, pp 467-470, issn 0040-6090, 4 p.Article

Correlation between texture and mechanical stress durability of thin aluminum filmsNÜSSL, R; JEWULA, T; RUILE, W et al.Thin solid films. 2014, Vol 556, pp 376-380, issn 0040-6090, 5 p.Article

Critical phenomena in dynamical Ising-typed thin films by effective-field theoryBAHADIR OZAN AKTAS; AKINCI, Ümit; POLAT, Hamza et al.Thin solid films. 2014, Vol 562, pp 680-691, issn 0040-6090, 12 p.Article

Crystallization mechanism of silicon quantum dots upon thermal annealing of hydrogenated amorphous Si-rich silicon carbide filmsGUOZHI WEN; XIANGBIN ZENG; WUGANG LIAO et al.Thin solid films. 2014, Vol 552, pp 18-23, issn 0040-6090, 6 p.Article

Cyclodextrin inclusion complexes with thiocholesterol and their self-assembly on gold: A combined electrochemical and lateral force microscopy analysisPANDEY, Rakesh K; LAKSHMINARAYANAN, V.Thin solid films. 2014, Vol 562, pp 367-371, issn 0040-6090, 5 p.Article

Dependence of photocurrent of poly(3-hexylthiophene)/n-type Si diodes upon incorporation of ZnO nanoparticlesLIN, Yow-Jon; CHIN, Yi-Min; TSAO, Hou-Yen et al.Thin solid films. 2014, Vol 550, pp 554-557, issn 0040-6090, 4 p.Article

Deposition and x-ray characterization of epitaxial thin films of LaAlO₃SØNSTEBY, Henrik Hovde; ØSTRENG, Erik; FJELLVAG, Helmer et al.Thin solid films. 2014, Vol 550, pp 90-94, issn 0040-6090, 5 p.Article