RASSEGNA DI ALCUNE DELLE PRINCIPALI TECNICHE DI INDAGINE DELLE SUPERFICI. II. SPETTROSCOPIA AUGER. SPETTROSCOPIA ELETTRONICA A RAGGI X (XPS). SPETTROSCOPIA ELETTRONICA ULTRAVIOLETTA = REVUE DE QUELQUES TECHNIQUES PRINCIPALES UTILISEES POUR L'ETUDE DES SURFACES. II. SPECTROSCOPIE AUGER. SPECTROSCOPIE ELECTRONIQUE PAR RX (XPS). SPECTROSCOPIE ELECTRONIQUE PAR UVCATTANIA SABBADINI MG; RAGAINI V; TESCARI M et al.1978; CHIM. E INDUSTR.; ITA; DA. 1978; VOL. 60; NO 8; PP. 656-666; BIBL. 48 REF.Article

ANWENDUNG DER PHOTOELEKTRONENSPEKTROSKOPIE ZUR OBERFLAECHENANALYTIK. = UTILISATION DE LA SPECTROSCOPIE PHOTOELECTRONIQUE POUR L'ANALYSE DE SURFACELEONHARDT G.1978; TECHNIK; DDR; DA. 1978; VOL. 33; NO 4; PP. 235-240; BIBL. 36 REF.Article

X-RAY ANALYSIS OF PARTICULATE MATTER COLLECTED IN AN ENVIRONMENTAL MONITORING DEVICE.COLLINS GCS; NICHOLAS D.1976; ANALYST; G.B.; DA. 1976; VOL. 101; NO 1208; PP. 901-911; BIBL. 17 REF.Article

QUANTITATIVE ANALYSIS BY X-RAY PHOTOELECTRON SPECTROSCOPY WITHOUT REFERENCE SAMPLESEBEL MF; EBEL H; HIROKAWA K et al.1982; SPECTROCHIM. ACTA, B: AT. SPECTROSC.; ISSN 0584-8547; GBR; DA. 1982; VOL. 37; NO 6; PP. 461-471; BIBL. 33 REF.Article

SELECTED AREA X-RAY PHOTOELECTRON SPECTROSCOPYKEAST DJ; DOWNING KS.1981; SURF. INTERFACE; ISSN 0142-2421; GBR; DA. 1981; VOL. 3; NO 2; PP. 99-101; BIBL. 3 REF.Article

X-RAY PHOTOELECTRON ANALYSIS OF SURFACE LAYERS WITH COMPOSITION GRADIENTSNEFEDOV VI.1981; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1981; VOL. 3; NO 2; PP. 72-75; BIBL. 9 REF.Article

SURFACE ANALYSIS OF INSB BY X-RAY PHOTOELECTRON SPECTROSCOPY (XPS).COPPERTHWAITE RG; KUNZE OA; LLOYD J et al.1978; Z. NATURFORSCH., A; DTSCH.; DA. 1978; VOL. 33; NO 5; PP. 523-527; BIBL. 15 REF.Article

USEFULNESS OF PHOTON MASS ATTENUATION COEFFICIENTS IN ELEMENTAL ANALYSISKOURIS K; SPYROU NM.1978; NUCL. INSTRUM. METHODS; NLD; DA. 1978; VOL. 153; NO 2-3; PP. 477-483; BIBL. 11 REF.Article

A NEW METHOD FOR DETERMINING SULFOXIDES IN PEPTIDE MOLECULES USING X-RAY PHOTOELECTRON SPECTROSCOPYJONES D; DISTEFANO G; TONIOLO C et al.1978; BIOPOLYMERS; USA; DA. 1978; VOL. 17; NO 11; PP. 2703-2713; BIBL. 47 REF.Article

LARGE-RAILGUN RESIDUE MATERIAL ANALYZED BY X-RAY PHOTOELECTRON SPECTROSCOPYWESTERDAHL CAL; PINTO J; FERRENTINO GL et al.1983; IEEE TRANSACTIONS ON MAGNETICS; ISSN 0018-9464; USA; DA. 1983; VOL. 19; NO 1; PP. 53-54; BIBL. 6 REF.Article

DETECTION ET ANALYSE DES RAYONS X PAR SPECTROSCOPIE D'ELECTRONS (APPLICATIONS AUX TECHNIQUES DE MICROANALYSE EN VOLUME ET EN SURFACE ET AUX STRUCTURES FINES DE L'ABSORPTION X) = DETECTION AND ANALYSIS OF X RAYS BY ELECTRON SPECTROSCOPY (APPLICATION TO VOLUME AND SURFACE MICROANALYTICAL TECHNIQUES AND TO FINE STRUCTURES OF X RAY ABSORPTION)CAZAUX JACQUES.1982; ; FRA; DA. 1982; DGRST/80 7 0563; 43 P.; 30 CM; BIBL. DISSEM.; ACTION CONCERTEE: INSTRUMENTS DE MESUREReport

ANALYSE QUANTITATIVE DE LA SURFACE DE SOLIDES PAR SPECTROMETRIE ELECTRONIQUE DE RXSERGUSHIN NP; NEFEDOV VI.1976; ZH. ANAL. KHIM.; S.S.S.R.; DA. 1976; VOL. 31; NO 11; PP. 2198-2204; ABS. ANGL.; BIBL. 10 REF.Article

BASIC ASSUMPTIONS AND RECENT DEVELOPMENTS IN QUANTITATIVE XPSCARLSON TA.1982; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1982; VOL. 4; NO 4; PP. 125-134; BIBL. 33 REF.Article

ELECTRON SPECTROSCOPY: ULTRAVIOLET AND X-RAY EXCITATIONBAKER AD; BRISK MA; LIOTTA DC et al.1980; ANAL. CHEM. (WASH.); ISSN 0003-2700; USA; DA. 1980; VOL. 52; NO 5; PP. 161-174; BIBL. 4 P.Article

APPLICATION DE LA SPECTROSCOPIE PHOTOELECTRONIQUE A L'ETUDE DE LA CATALYSE ET DE L'ADSORPTIONMINACHEV KH M; ANTOSHIN GV; SHPIRO ES et al.1978; USP. KHIM.; SUN; DA. 1978; VOL. 47; NO 12; PP. 2097-2133; BIBL. 332 REF.Article

SURFACE ANALYSIS BY ELECTRON SPECTROSCOPY.BAKER BG.1975; MOD. ASPECTS ELECTROCHEM.; G.B.; DA. 1975; NO 10; PP. 93-160; BIBL. 4 P. 1/2Article

SURFACE ANALYSIS BY MEANS OF PHOTOEMISSION AND OTHER PHOTON-STIMULATED-PROCESSES.SPICER WE.1976; C.R.C. CRIT. REV. SOLID STATE SCI.; U.S.A.; DA. 1976; VOL. 6; NO 3; PP. 317-336; BIBL. 2 P.Article

LE XSAM 800. UNE NOUVELLE CONCEPTION DE L'ANALYSE DE SURFACEPETIT R; ALFORD NA; DRUMMOND IW et al.1981; ANALUSIS; ISSN 0365-4877; FRA; DA. 1981; VOL. 9; NO 3; PP. 88-92; ABS. ENG; BIBL. 3 REF.Article

QUANTITATIVE COMPARISON OF DIRECT AND DERIVATIVE AES WITH XPS OF METAL SULFIDESGRIFFIS DP; LINTON RW.1982; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1982; VOL. 4; NO 5; PP. 197-203; BIBL. 21 REF.Article

CARBON CONTAMINANT BUILDUP AND SPUTTERING BEHAVIOUR ON ZINC OXIDE DURING XPS EXAMINATIONMINTAS M; FILBY GW.1981; Z. NATURFORSCH., A; ISSN 0340-4811; DEU; DA. 1981; VOL. 36; NO 2; PP. 140-143; BIBL. 16 REF.Article

THE QUANTITATIVE ANALYSIS OF SURFACES BY XPS: A REVIEWSEAH MP.1980; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1980; VOL. 2; NO 6; PP. 222-239; BIBL. 61 REF.Article

PHOTOELECTRON SPECTROSCOPY OF E AND A GLASS FIBERS.BRION D; ESCARD J; WINTER C et al.1978; AMER. CERAM. SOC. BULL.; U.S.A.; DA. 1978; VOL. 57; NO 4; PP. 444-451 (5P.); BIBL. 17 REF.Article

AN ASYMMETRIC MODEL FOR XPS ANALYSISDUNN WL; DUNN TS.1982; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1982; VOL. 4; NO 3; PP. 77-88; BIBL. 13 REF.Article

AN EXPERIMENTAL AND THEORETICAL STUDY OF THE TRANSMISSION FUNCTION OF A COMMERCIAL HEMISPHERICAL ELECTRON ENERGY ANALYSERHUGHES AE; PHILLIPS CC.1982; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1982; VOL. 4; NO 5; PP. 220-226; BIBL. 7 REF.Article

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