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Results 1 to 25 of 354149

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UTILISATION DU RELEVE TOPOGRAPHIQUE DANS L'IRRADIATION MONOCHROMATIQUE A PARTIR D'UNE SOURCE PONCTUELLE DE RXZASIMCHUK IK; FOMIN AV.1978; METALLOFIZIKA; UKR; DA. 1978; NO 72; PP. 112-117; BIBL. 7 REF.Article

A NEW SYSTEM FOR ON-LINE X-RAY TOPOGRAPHYKOMYAK NI; LUTSAU VG; EFANOV VP et al.1980; X-RAY SPECTROM.; GBR; DA. 1980; VOL. 9; NO 1; PP. 36-37; BIBL. 5 REF.Article

IMAGING OF LATTICE DEFECTS BY DOUBLE DIFFRACTOMETRIC TRANSMISSION TOPOGRAPHY = ABBILDUNG VON GITTERDEFEKTEN DURCH DOPPELBRECHUNGS-TRANSMISSIONSTOPOGRAPHIE = REPRESENTATION DES DEFAUTS DE RESEAU PAR TOPOGRAPHIE EN TRANSMISSION BIREFRINGENTERENNINGER M.1982; PHYS. STATUS SOLIDI (A), APPL. RES.; DDR; DA. 1982-03; VOL. 70; NO 1; PP. 183-188; BIBL. 6 REF.Article

WIRE BONDING PROCESS CHARACTERIZATION BY X-RAY DIFFRACTION TOPOGRAPHYYASUAMI S; MIKAMI H; FUJITSU T et al.1982; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1982; VOL. 129; NO 4; PP. 846-850; BIBL. 5 REF.Article

CHARACTERIZATION OF DICING PROCESS BY X-RAY SECTION TOPOGRAPHYYASUAMI S.1980; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1980; VOL. 127; NO 6; PP. 1404-1406; BIBL. 5 REF.Article

TEXTURTOPOGRAPHIE = TOPOGRAPHIE DE TEXTUREBORN E.1979; KRISTALL U. TECH.; DDR; DA. 1979; VOL. 14; NO 3; PP. 325-332; ABS. ENG; BIBL. 3 REF.Article

THEORIE DU CONTRASTE DE BORRMANN DES DISLOCATIONS REVUE)TIKHONOVA EA.1976; UKRAIN. FIZ. ZH.; S.S.S.R.; DA. 1976; VOL. 21; NO 5; PP. 709-735; ABS. ANGL.; BIBL. 52 REF.Article

VISCOELASTIC BEHAVIOUR OF OXIDE FILMS ON SILICON CRYSTALSNISHINO Y; IMURA T.1982; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1982; VOL. 74; NO 1; PP. 193-200; ABS. GER; BIBL. 11 REF.Article

ROENTGENTOPOGRAPHIE MIT EXTREMWERTNACHFUEHRUNG. I. PRINZIP DER NACHFUEHRUNG UND BILDVERZEICHNUNG. = TOPOGRAPHIE RX AVEC GUIDAGE A LA VALEUR EXTREME. I. PRINCIPE DU GUIDAGE ET DISTORSION DE L'IMAGEALEX V; HANSCH C; NAUMANN E et al.1978; KRISTALL U. TECH.; DTSCH.; DA. 1978; VOL. 13; NO 1; PP. 87-94; ABS. ANGL.; BIBL. 10 REF.Article

CHANGE OF INTERFERENCE PATTERN IN THE X-RAY SECTION TOPOGRAPHY OF SINGLE CRYSTALS WITH INCREASING DIMENSIONS OF AN INCOHERENT SOURCEARISTOV VV; KOHN VG; POLOVINKINA VI et al.1982; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1982; VOL. 72; NO 2; PP. 483-491; ABS. RUS; BIBL. 16 REF.Article

X-RAY DIFFRACTION INVESTIGATIONS OF HIGH ENERGY ALPHA -PARTICLE DAMAGE IN SILICONWIETESKA K.1981; PHYS. STATUS SOLIDI (A), APPL. RES.; DDR; DA. 1981-11; VOL. 68; NO 1; PP. 179-185; BIBL. 5 REF.Article

LANG CAMERA FOR LARGE SCALE X-RAY TRANSMISSION TOPOGRAPHY.LINDEGAARD ANDERSEN A; RIBE B.1976; J. PHYS. E; G.B.; DA. 1976; VOL. 9; NO 8; PP. 659-661; BIBL. 9 REF.Article

A NOVEL HIGH-TEMPERATURE TENSILE STAGE FOR LIVE X-RAY TOPOGRAPHYBAUMGART H; MARKEWITZ G; HARTMANN W et al.1980; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1980; VOL. 13; NO 6; PP. 601-604; BIBL. 7 REF.Article

A GENERAL REVIEW OF SYNCHROTRON RADIATION, ITS USES AND SPECIAL TECHNOLOGIESWILLIAMS GP.1982; VACUUM; ISSN 0042-207X; GBR; DA. 1982; VOL. 32; NO 6; PP. 333-345; BIBL. 17 REF.Article

X-RAY TOPOGRAPHY UNDER CONDITIONS OF MONOCHROMATIC SPHERICAL WAVE DIFFRACTIONARISTOV VV; ISHIKAWA T; KIKUTA S et al.1981; JAPANESE JOURNAL OF APPLIED PHYSICS; ISSN 0021-4922; JPN; DA. 1981; VOL. 20; NO 10; PP. 1947-1953; BIBL. 13 REF.Article

INTERPRETATION OF X-RAY TOPOGRAPHYEPELBOIN Y.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 555-563; BIBL. 2 P.Conference Paper

DETERMINATION OF THE THICKNESS OF THE FERROELECTRIC DOMAIN BOUNDARY IN TRIGLYCINE SULPHATE BY X-RAY TOPOGRAPHYPARPIA DY.1982; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1982; VOL. 46; NO 4; PP. 691-697; BIBL. 10 REF.Article

AN AUTOMATIC FLANK CONTROL FOR DOUBLE-CRYSTAL X-RAY TOPOGRAPHYBONSE U; LOTSCH H.1981; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1981; VOL. 14; NO 11; PP. 1248-1249; BIBL. 6 REF.Article

X-RAY TOPOGRAPHY: PRINCIPLESMALGRANGE C.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 302-309; BIBL. 37 REF.Conference Paper

METHODE NOUVELLE DE BALAYAGE POUR LA VISUALISATION DES TOPOGRAPHIES DE RAYONS XSHABOYAN SA; BEZIRGANYAN PA; EHJRAMDZHYAN TO et al.1976; IZVEST. AKAD. NAUK ARM. S.S.R., FIZ.; S.S.S.R.; DA. 1976; VOL. 11; NO 4; PP. 311-315; ABS. ARM. ANGL.; BIBL. 3 REF.Article

EXAMPLES OF X-RAY TOPOGRAPHIC RESULTSMATHIOT A.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 310-319; BIBL. 29 REF.Conference Paper

ASYMMETRIC CRYSTAL TOPOGRAPHIC CAMERA.BOETTINGER WJ; BURDETTE HE; KURIYAMA M et al.1976; REV. SCI. INSTRUM.; U.S.A.; DA. 1976; VOL. 47; NO 8; PP. 906-911; BIBL. 21 REF.Article

EXPLANATION OF CONTRAST EFFECTS IN SYNCHROTRON X-RAY TOPOGRAPHS OF BENT CRYSTALS BY MEANS OF MULTIPLE DIFFRACTIONNAUKKARINEN K; TUOMI T.1982; PHYS. STATUS SOLIDI (A), APPL. RES.; DDR; DA. 1982-02; VOL. 69; NO 2; PP. 687-697; BIBL. 13 REF.Article

A NEW METHOD FOR POWDER DIFFRACTION PHASE ANALYSIS = EIN NEUES VERFAHREN ZUR ROENTGENOGRAPHISCHEN PHASENANALYSE = UN NOUVEAU PROCEDE D'ANALYSE DE PHASE PAR RAYONS XFIALA J.1982; CRYST. RES. TECH.; DDR; DA. 1982-05; VOL. 17; NO 5; PP. 643-650; BIBL. 14 REF.Article

A STATISTICAL DYNAMICAL THEORY OF DIFFRACTION IN CRYSTALSKATO N.1982; INDIAN JOURNAL OF PHYSICS A AND PROCEEDINGS OF THE INDIAN ASSOCIATION FOR THE CULTIVATION OF SCIENCE A; ISSN 0252-9262; IND; DA. 1982; VOL. 65; NO 2; PP. 127-138; BIBL. 25 REF.Article

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