Simulation and optimization on the squeeze-film damping of a novel high-g accelerometer
- Author
- ZUNXIAN YANG1 ; XINXIN LI2
[1] Department of Electronics Science and Applied Physics, Fuzhou University, Fuzhou 350002, China
[2] Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China - Source
Microelectronics journal. 2006, Vol 37, Num 5, pp 383-387, 5 p ; ref : 8 ref
- ISSN
- 0959-8324
- Scientific domain
- Electronics
- Publisher
- Elsevier Science, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- Curved overload protection High-g accelerometer Shock response Squeeze-film damping
- Keyword (fr)
- Accéléromètre Amortissement Caractéristique dynamique Essai choc Fonction réponse Optimisation Packaging électronique Poutre cantilever Tension sortie
- Keyword (en)
- Accelerometer Damping Dynamic characteristic Impact test Response function Optimization Electronic packaging Cantilever beam Output voltage
- Keyword (es)
- Acelerómetro Amortiguación Característica dinámica Ensayo choque Función respuesta Optimización Packaging electrónico Viga cantilever Voltage salida
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 17601157
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.mejo.2005.07.005 
https://dx.doi.org/10.1016/j.mejo.2005.07.005
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