Oxygen defects in irradiated germanium
- Auteur
- CARVALHO, A1 ; JONES, R1 ; TORRES, V. J. B2 ; COUTINHO, J2 ; MARKEVICH, V3 ; OBERG, S4 ; BRIDDON, P. R5
[1] School of Physics, University of Exeter, Stocker Road, Exeter EX4 4QL, United Kingdom
[2] Department of Physics, University of Aveiro, 3810 Aveiro, Portugal
[3] University of Manchester, Manchester M60 1 QD, United Kingdom
[4] Department of Mathematics, LuleÅ University of Technology, LuleÅ 97187, Sweden
[5] School of Natural Sciences, University of Newcastle upon Tyne, NE1 7RU, Newcastle upon Tyne, United Kingdom - Titre de la conférence
- Papers presented at the second international workshop: Coordination action on defects relevant to engineering silicon-based devices (Crete, September 2006)
- Nom de la conférence
- Coordination Action on Defects Relevant to Engineering Silicon-Based Devices. International Workshop (2 ; Kalives, Crete 2006-09-08)
- Auteur (monographie)
- EVANS-FREEMAN, Jan (Editor)1
European Commission, CADRES Project, Europe (Organiser of meeting)
[1] Sheffield Hallam University, Sheffield, United Kingdom - Source
Journal of materials science. Materials in electronics. 2007, Vol 18, Num 7, pp 781-786, 6 p ; ref : 34 ref
- ISSN
- 0957-4522
- Domaine scientifique
- Electronics; Condensed state physics
- Editeur
- Springer, Norwell, MA
- Pays de publication
- United States
- Type de document
- Conference Paper
- Langue
- English
- Mot clé (fr)
- Barrière énergie Effet Hall Energie activation Germanium Modélisation Oxygène Recuit Spectrométrie IR Spectrométrie transitoire niveau profond Ge O
- Mot clé (en)
- Energy barrier Hall effect Activation energy Germanium Modeling Oxygen Annealing Infrared spectrometry Deep level transient spectrometry
- Mot clé (es)
- Barrera energía Efecto Hall Energía activación Germanio Modelización Oxígeno Recocido Espectrometría IR Espectrometría transitoria nivel profundo
- Classification
- Pascal
- 001 Sciences exactes et technologie / 001D Sciences appliquees / 001D03 Electronique / 001D03C Matériaux
- Discipline
- Electronics
- Provenance
- Inist-CNRS
- Base de données
- PASCAL
- Identifiant INIST
- 18965031
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/s10854-006-9083-6 
https://dx.doi.org/10.1007/s10854-006-9083-6
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