From depth resolution to depth resolution function : Refinement of the concept for delta layers, single layers and multilayers
- Auteur
- HOFMANN, S1 2
[1] Max-Planck-Institute for Metals Research, Seestrasse 92, 70174 Stuttgart, Germany
[2] National Research Institute for Metals, 1-2-1 Sengen, Tsukuba 305, Japan - Source
Surface and interface analysis. 1999, Vol 27, Num 9, pp 825-834 ; ref : 35 ref
- CODEN
- SIANDQ
- ISSN
- 0142-2421
- Domaine scientifique
- General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
- Editeur
- Wiley, Chichester
- Pays de publication
- United Kingdom
- Type de document
- Article
- Langue
- English
- Mot clé (fr)
- Analyse quantitative Article synthèse Couche mince Multicouche Profil profondeur Résolution profondeur
- Mot clé (en)
- Quantitative chemical analysis Reviews Thin films Multilayers Depth profiles Depth resolution
- Mot clé (es)
- Resolución profondidad
- Classification
- Pascal
- 001 Sciences exactes et technologie / 001B Physique / 001B80 Domaines interdisciplinaires: science des materiaux; rheologie / 001B80A Science des matériaux / 001B80A70 Essais sur les matériaux
- Pacs
- 8170J
- Discipline
- Physics and materials science
- Provenance
- Inist-CNRS
- Base de données
- PASCAL
- Identifiant INIST
- 1936011
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/(SICI)1096-9918(199909)27:9<825::AID-SIA638>3.0.CO;2-D 
https://dx.doi.org/10.1002/(SICI)1096-9918(199909)27:9<825::AID-SIA638>3.0.CO;2-D
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