Inkjet printed resistive and chemical-FET carbon nanotube gas sensors

Author

MAKLIN, Jani¹ ; MUSTONEN, Tero¹ ; GINGL, Zoltan⁴ ; HESZLER, Péter⁵ ; VAJTAI, Robert⁶ ; AJAYAN, Pulickel M⁷ ; HALONEN, Niina¹ ; TOTH, Geza¹ ; KORDAS, Krisztian¹ ; VÄHÄKANGAS, Jouko¹ ; MOILANEN, Hannu² ; KUKOVECZ, Akos³ ; KONYA, Zoltan³ ; HASPE, Henrik³
[1] Microelectronics and Materials Physics Laboratories, and EMPART Research Group of Infotech Oulu, University of Oulu, P.O. Box 8500, University of Oulu, 90014, Finland
[2] Laserprobe LP Ltd., Jussintie 7, 90800 Oulu, Finland
[3] Department of Applied and Environmental Chemistry, University of Szeged, Rerrich B. tér 1, 6720 Szeged, Hungary
[4] Department of Experimental Physics, University of Szeged, Dóm tér 9, 6720 Szeged, Hungary
[5] Research Group on Laser Physics of the Hungarian Academy of Sciences, University of Szeged, P.O. Box 406, 6701 Szeged, Hungary
[6] Rensselaer Nanotechnology Center, Rensselaer Polytechnic Institute, Troy, New York 12180, United States
[7] Department of Mechanical Engineering and Materials Science, Rice University, Houston, Texas 77251-1892, United States

Conference title

22nd International Winterschool on Electronic Properties of Novel Materials: Molecular nanostructures

Conference name

Winterschool on Electronic Properties of Novel Materials (IWEPNM 2008) (IWEPNM 2008) (22 ; Kirchberg, Tirol 2008-03-01)

Author (monograph)

THOMSEN, Christian (Editor)¹ ; DINSE, Peter (Editor)² ; KUZMANY, Hans (Editor)³ ; ROTH, Siegmar (Editor)⁴
[1] Institut für Festkörperphysik, TU Berlin, PN 5-4, Hardenbrgstrasse 36, 10623 Berlin, Germany
[2] Technische Universität Darmstadt, Institut für Physikalische Chemie, Petersenstrasse 20, 64287 Darmstadt, Germany
[3] Fakultät für Physik, Institut für Materialphysik, Strudlhofgasse 4, 1090 Wien, Austria
[4] MPI für Festkörperforschung, Heisenberg Strasse 1, 70569 Stuttgart, Germany

Source

Physica status solidi. B. Basic research. 2008, Vol 245, Num 10, pp 2335-2338, 4 p ; ref : 19 ref

CODEN

PSSBBD

ISSN

0370-1972

Scientific domain

Crystallography; Electronics; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics

Publisher

Wiley, Berlin

Publication country

Germany

Document type

Conference Paper

Language

English

Keyword (fr)

Capteur de gaz Caractéristique courant tension Dispositif nanotube Effet non linéaire Epaisseur Loi Ohm Modification chimique Nanotube carbone Nanotube monofeuillet Phénomène transport Sérigraphie Transistor effet champ

Keyword (en)

Gas sensors Voltage current curve Nanotube devices Non linear effect Thickness Ohm law Chemical modification Carbon nanotubes Singlewalled nanotube Transport process Serigraphy Field effect transistor

Keyword (es)

Característica corriente tensión Efecto no lineal Espesor Ley Ohm Modificación química Nanotubo pared única Fenómeno transporte Serigrafía Transistor efecto campo

Classification

Pascal

001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques / 001B00G07D Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

Pascal

001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors

Discipline

Electronics Metrology

Origin

Inist-CNRS

Database

PASCAL

INIST identifier

20829696

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS