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Increasing of the EUV resist's sensitivity

Author
KITAI, M. S1 ; SOROKA, A. M2 ; RUDOI, I. G3
[1] Institute on Laser Information Technologies of Russian Academy of Sciences; Pioneskaya str., 2, Troitsk, 142190, Moscow Region, Russian Federation
[2] JSC Innovation-manufacturing Complex Besedy, Moscow Region, Russian Federation
[3] JSC MagAlTech, Moscow, Russian Federation
Conference title
Fundamentals of laser-assisted micro- and nanotechnologies 2010 (5-8 July 2010, St. Petersburg, Russian Federation)
Conference name
Fundamentals of laser-assisted micro- and nanotechnologies (St. Petersburg 2010)
Author (monograph)
Veiko, Vadim P (Editor); Vartanyan, Tigran A (Editor)
SPIE, United States (Organiser of meeting)
St. Petersburg State University of Information technologies, Mechanics and Optics, Russian Federation (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7996 ; 799612.1-799612.10 ; ref : 16 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-8569-4
Scientific domain
Electronics; Optics; Physics
Publisher
SPIE, Bellingham, Wash
Publication country
United States
Document type
Conference Paper
Language
Russian
Keyword (fr)
Application laser Lithographie Polymère Rayonnement UV extrême 0130C 4262
Keyword (en)
Laser beam applications Lithography Polymers Extreme ultraviolet radiation
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B62 Biological and medical applications

Discipline
Physics : optics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
24106466

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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