Influence of ethanol content in the precursor solution on anodic electrodeposited CeO2 thin films
- Auteur
- YANG YANG1 ; YUMENG YANG1 ; TAIWEN FU; JUAN ZHU1 ; JINPENG FAN1 ; ZHAO ZHANG1 ; JIANQING ZHANG1 2
[1] Department of Chemistry, Zhejiang University, Hangzhou, Zhejiang 310027, China
[2] State Key Laboratory for Corrosion and Protection of Metals, Shenyang 110016, China - Source
Thin solid films. 2014, Vol 556, pp 128-136, 9 p ; ref : 54 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Domaine scientifique
- Crystallography; Metallurgy, welding; Condensed state physics
- Editeur
- Elsevier, Amsterdam
- Pays de publication
- Netherlands
- Type de document
- Article
- Langue
- English
- Mot clé auteur
- Anodic electrodeposition Cerium oxide films Corrosion property Ethanol
- Mot clé (fr)
- Acier inoxydable 316L Corrosion Couche mince métallique Couche mince Diffraction RX Dépôt électrolytique Ellipsométrie Epaisseur couche Ethanol Microscopie électronique balayage Or Porosité Précurseur Revêtement électrodéposé Résistance corrosion Spectre photoélectron RX Spectrométrie Raman Spectroscopie impédance électrochimique Stoechiométrie Valence 0760F 6855J 8115P
- Mot clé (en)
- Stainless steel-316L Corrosion Metallic thin films Thin films XRD Electrodeposition Ellipsometry Layer thickness Ethanol Scanning electron microscopy Gold Porosity Precursor Electrodeposited coatings Corrosion resistance X-ray photoelectron spectra Raman spectroscopy Electrochemical impedance spectroscopy Stoichiometry Valence
- Mot clé (es)
- Espesor capa Espectrometría impedancia electroquímica
- Classification
- Pascal
- 001 Sciences exactes et technologie / 001B Physique / 001B00 Generalites / 001B00G Instruments, appareillage, composants et techniques communs à plusieurs branches de la physique et de l'astronomie / 001B00G60 Instrumentation, équipement et techniques optiques / 001B00G60F Polarimètres et ellipsomètres
- Pascal
- 001 Sciences exactes et technologie / 001B Physique / 001B60 Etat condense: structure, proprietes mecaniques et thermiques / 001B60H Surfaces et interfaces; couches minces et trichites (structure et propriétés non électroniques) / 001B60H55 Structure et morphologie de couches minces / 001B60H55J Structure et morphologie; épaisseur
- Pascal
- 001 Sciences exactes et technologie / 001B Physique / 001B80 Domaines interdisciplinaires: science des materiaux; rheologie / 001B80A Science des matériaux / 001B80A15 Méthodes de dépôt de films et de revêtements; croissance de films et épitaxie / 001B80A15P Electrodépôt
- Discipline
- Metrology Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Provenance
- Inist-CNRS
- Base de données
- PASCAL
- Identifiant INIST
- 28331823
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2014.01.030 
https://dx.doi.org/10.1016/j.tsf.2014.01.030
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