Dynamics and memory effects in rupture of thermal fuse networks
- Auteur
- SORNETTE, D; VANNESTE, C
Univ. Nice-Sophia Antipolis, lab. physique matière condensée, Nice 06034, France - Source
Physical review letters. 1992, Vol 68, Num 5, pp 612-615 ; ref : 11 ref
- CODEN
- PRLTAO
- ISSN
- 0031-9007
- Domaine scientifique
- Optics; Atomic molecular physics; Condensed state physics; Physics; Plasma physics
- Editeur
- American Physical Society, Ridge, NY
- Pays de publication
- United States
- Type de document
- Article
- Langue
- English
- Mot clé (fr)
- Effet mémoire Modèle statique Processus stochastique Réseau aléatoire Réseau résistance Modèle état critique Percolation lien
- Mot clé (en)
- Memory effect Static model Stochastic process Random grating Resistor network Critical state model Bond percolation
- Mot clé (es)
- Efecto memoria Modelo estático Proceso estocástico Red aleatoria Red resistencia
- Classification
- Pascal
- 001 Sciences exactes et technologie / 001B Physique / 001B00 Generalites / 001B00E Physique statistique, thermodynamique, et systèmes dynamiques non linéaires / 001B00E40 Fluctuations, processus stochastiques, bruit, et mouvement brownien
- Discipline
- Theoretical physics
- Provenance
- Inist-CNRS
- Base de données
- PASCAL
- Identifiant INIST
- 5475814
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1103/PhysRevLett.68.612 
https://dx.doi.org/10.1103/PhysRevLett.68.612
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