Kelvin probe force microscopy
- Auteur
- NONNEMACHER, M; O'BOYLE, M. P; WICKRAMASINGHE, H. K
IBM, T. J. Watson res. cent., Yorktown Heights NY 10598, United States - Source
Applied physics letters. 1991, Vol 58, Num 25, pp 2921-2923 ; ref : 16 ref
- CODEN
- APPLAB
- ISSN
- 0003-6951
- Domaine scientifique
- Crystallography; Electronics; Optics; Condensed state physics
- Editeur
- American Institute of Physics, Melville, NY
- Pays de publication
- United States
- Type de document
- Article
- Langue
- English
- Mot clé (fr)
- Différence potentiel Détection hétérodyne Interféromètre Microscope balayage Méthode mesure Or Palladium Platine Surface Topographie
- Mot clé (en)
- Potential difference Heterodyne detection Interferometer Scanning microscope Measurement method Gold Palladium Platinum Surface Topography
- Mot clé (es)
- Diferencia potencial Detección heterodina Interferómetro Microscopio barrido Método medida Oro Paladio Platino Superficie Topografía
- Classification
- Pascal
- 001 Sciences exactes et technologie / 001B Physique / 001B60 Etat condense: structure, proprietes mecaniques et thermiques / 001B60H Surfaces et interfaces; couches minces et trichites (structure et propriétés non électroniques)
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Provenance
- Inist-CNRS
- Base de données
- PASCAL
- Identifiant INIST
- 5528621
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.105227 
https://dx.doi.org/10.1063/1.105227
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