SURFACE ANALYSIS AND ANGULAR DISTRIBUTIONS IN X-RAY PHOTOELECTRON SPECTROSCOPY
- Auteur
- FADLEY CS; BAIRD RJ; SIEKHAUS W; NOVAKOV T; BERGSTROM SAL
DEP. CHEM., UNIV. HAWAII, HONOLULU, HAWAII 96822, U.S.A. - Source
- J. ELECTRON SPECTROSC. RELAT. PHENOMENA; NETHERL.; DA. 1974; VOL. 4; NO 2; PP. 93-137; BIBL. 30 REF.
- Type de document
- Article
- Langue
- English
- Mot clé (fr)
- COUCHE SUPERFICIELLE COUCHE MINCE ANALYSE CHIMIQUE SPECTROMETRIE PHOTOELECTRONIQUE PHOTOEXCITATION RX DISTRIBUTION ANGULAIRE EMISSION PHOTOELECTRONIQUE RAYON X SURFACE SPECTROMETRIE PARTICULE CHARGEE CHIMIE ANALYTIQUE PHYSIQUE SOLIDE
- Mot clé (en)
- ANALYTICAL CHEMISTRY SOLID PHYSICS
- Mot clé (es)
- QUIMICA ANALYTICA FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Sciences exactes et technologie / 001B Physique / 001B60 Etat condense: structure, proprietes mecaniques et thermiques
- Discipline
- General chemistry and physical chemistry Physics of condensed state : structure, mechanical and thermal properties
- Provenance
- Inist-CNRS
- Base de données
- PASCAL
- Identifiant INIST
- PASCAL7517016093
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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