Mounting an EUV Schwarzschild microscope lensPESCHEL, Thomas; BANSE, Henrik; DAMM, Christoph et al.Proceedings of SPIE, the International Society for Society Engineering. 2005, pp 59621H.1-59621H.8, issn 0277-786X, isbn 0-8194-5980-1, 2VolConference Paper

An in situ scanning-slit alignment system for Kirkpatrick-Baez opticsNAULLEAU, Patrick P; BATSON, Phil; DENHAM, Paul et al.Optics communications. 2002, Vol 212, Num 4-6, pp 225-233, issn 0030-4018, 9 p.Article

Linear alignment correction algorithm for deep submicron lithographyZIGER, David H; LEROUX, Pierre.SPIE proceedings series. 2002, isbn 0-8194-4435-9, 2Vol, vol 2, 1057-1069Conference Paper

A hinge goniometer headKATRUSIAK, A.Journal of applied crystallography. 1999, Vol 32, pp 576-578, issn 0021-8898, 3Article

Relativity mission requires custom-built detector mountsSULLIVAN, M; BYE, M.Laser focus world. 1998, Vol MAR, pp 27-31, issn 1043-8092, SUPArticle

System performance can hinge on mirror mountsARNONE, D; SHINE, B.Laser focus world. 1998, Vol 34, Num 2, pp 145-150, issn 1043-8092, 4 p.Article

Planification du placement de caméras pour des mesures 3D de précision = Planning Camera Placement for Accurate 3D MeasurementsOlague, Gustavo; Mohr, Roger.1998, 138 p.Thesis

Displacement control of piezoelectric element by feedback of induced chargeFURUTANI, K; URUSHIBATA, M; MOHRI, N et al.Nanotechnology (Bristol. Print). 1998, Vol 9, Num 2, pp 93-98, issn 0957-4484Conference Paper

A super-precision linear slideway with angular correction in three axesMONTEIRO, A. F; SMITH, S. T; CHETWYND, D. G et al.Nanotechnology (Bristol. Print). 1996, Vol 7, Num 1, pp 27-36, issn 0957-4484Article

Geometrical method for the determination of the position and orientation of a scanning Laser Doppler VibrometerZENG, X; WICKS, A. L; MITCHELL, L. D et al.Optics and lasers in engineering. 1996, Vol 25, Num 4-5, pp 247-264, issn 0143-8166Conference Paper

Pick the proper positioner for location control needsDEMEIS, R.Laser focus world. 1995, Vol 31, Num 8, pp 89-98, issn 1043-8092, 7 p.Article

Micropositioning of a measuring volume in laser Doppler anemometryBERTRAND, C; DESEVAUX, P; PRENEL, J. P et al.Experiments in fluids. 1993, Vol 16, Num 1, pp 70-72, issn 0723-4864Article

Inexpensive two-tip nanomanipulator for a SEMNAKABAYASHI, D; SILVA, P. C; UGARTE, D et al.Applied surface science. 2007, Vol 254, Num 1, pp 405-411, issn 0169-4332, 7 p.Conference Paper

Analytical expressions for optimum alignment modes of highly segmented mirrorsNOETHE, L.Journal of modern optics (Print). 2005, Vol 52, Num 4, pp 603-632, issn 0950-0340, 30 p.Article

First-order perturbations of reflective surfaces and their effects in interferometric testing of mirrorsROBINSON, Brian M; REARDON, Patrick J.Journal of modern optics (Print). 2005, Vol 52, Num 18, pp 2625-2636, issn 0950-0340, 12 p.Article

Double closed-loop control of the focal point position in laser beam weldingXUDONG ZHANG; WUZHU CHEN; PING JIANG et al.Measurement science & technology (Print). 2003, Vol 14, Num 11, pp 1938-1943, issn 0957-0233, 6 p.Article

Positioning method based on digital moiréTORROBA, R; BOLOGNINI, N; TEBALDI, M et al.Optics communications. 2002, Vol 209, Num 1-3, pp 1-6, issn 0030-4018Article

Rigorous electromagnetic simulation of stepper alignmentPISTON, Thomas V; SOCHA, Robert J.SPIE proceedings series. 2002, isbn 0-8194-4435-9, 2Vol, vol 2, 1045-1056Conference Paper

Optomechanics provides many mounting choicesSEBASTIAN, Rick.Laser focus world. 2001, Vol 37, Num 5, pp 259-264, issn 1043-8092Article

A high-temperature furnace for X-ray diffraction with directly machined α-Al₂O₃ ceramic partsESTERMANN, M; REIFLER, H; STEURER, W et al.Journal of applied crystallography. 1999, Vol 32, pp 833-836, issn 0021-8898, 4Article

A device for low-temperature crystal reorientation in data collection with the oscillation methodDAROVSKY, A; COPPENS, P.Journal of applied crystallography. 1998, Vol 31, pp 296-298, issn 0021-8898, 2Article

A bimorph-driven inertial micropositioner for scanning tunnelling microscopyLANYI, S; REHUREK, P; TURZO, I et al.Measurement science & technology (Print). 1995, Vol 6, Num 4, pp 365-370, issn 0957-0233Article

Particle micromanipulator consisting of two orthogonal channels with travelling-wave-electrode structuresFUHR, G; FIEDLER, S; MÜLLER, T et al.Sensors and actuators. A, Physical. 1994, Vol 41, Num 1-3, pp 230-239, issn 0924-4247Conference Paper

Easily made device for increasing the manipulation length of a high precision ultrahigh vacuum manipulatorREISFELD, G; RABI, S.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 5, pp 2854-2855, issn 0734-2101Article

Performance of an ultrahigh-vacuum sample transfer system for investigation of molecular-beam epitaxy grown semiconductor surfacesWANG, X.-S; HUANG, C; BRESSLER-HILL, V et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 5, pp 2860-2862, issn 0734-2101Article