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Internal scattering of electrons in a hemispherical spectrometerGREENWOOD, J. C; PRUTTON, M; ROBERTS, R. H et al.Surface and interface analysis. 1993, Vol 20, Num 11, pp 891-900, issn 0142-2421Article

Vertical differential charging in monochromtized small spot X-ray photoelectron spectroscopyXIANG-RONG YU; HANTSCHE, H.Surface and interface analysis. 1993, Vol 20, Num 7, pp 555-558, issn 0142-2421Article

Preliminary results from the development of a transmission X-ray photoelectron spectrometerJENKINS, S. N; CASTLE, J. E.Surface and interface analysis. 1993, Vol 20, Num 12, pp 935-940, issn 0142-2421Article

Scattering in electron spectrometers, diagnosis and avoidance. II: Cylindrical mirror analysersSEAH, M. P.Surface and interface analysis. 1993, Vol 20, Num 11, pp 876-890, issn 0142-2421Article

Extending the range of the time projection Compton spectrometer to lower energyBALDWIN, G. T; LANDRON, C. O; LORENCE, L. J et al.IEEE transactions on nuclear science. 1993, Vol 40, Num 4, pp 664-668, issn 0018-9499Conference Paper

Hypocycloidal electron monochromator with a nonuniform electric field and its optimizationROMANYUK, N. I; SHPENIK, O. B; MANDI, I. A et al.Technical physics. 1993, Vol 38, Num 7, pp 599-603, issn 1063-7842Article

Scattering in electron spectrometers, diagnosis and avoidance. I: Concentric hemispherical analysersSEAH, M. P.Surface and interface analysis. 1993, Vol 20, Num 11, pp 865-875, issn 0142-2421Article

Construction of a large superconducting spectrometer dipole magnet with negative curvatureZELLER, A. F; BRICKER, S; DEKAMP, J. C et al.IEEE transactions on applied superconductivity. 1993, Vol 3, Num 1, pp 114-117, issn 1051-8223, 2Conference Paper

Development of imaging energy analyzer using multipole Wien filterNIIMI, H; KATO, M; TSUTSUMI, T et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 131-134, issn 0169-4332, 4 p.Conference Paper

Computer simulation on supercritical carbon dioxide fluid : a potential model for the benzene-carbon dioxide system from ab initio calculationsJUN-WEI SHEN; DOMANSKI, K. B; KITAO, O et al.Fluid phase equilibria. 1995, Vol 104, pp 375-390, issn 0378-3812Conference Paper

Immitance spectroscopy of smart components and novel devicesALIM, M. A; SANJIDA KHANAM; SEITZ, M. A et al.Active and passive electronic components. 1994, Vol 16, Num 3-4, pp 153-170, issn 0882-7516Article

The chromatic image shift in spatially resolved EELSSCHATTSCHNEIDER, P; JOUFFREY, B; TISCHLER, C et al.Ultramicroscopy. 1994, Vol 53, Num 3, pp 181-190, issn 0304-3991Article

Automatic removal of substrate backscattering effects in Auger imaging and spectroscopyBARKSHIRE, I. R; PRUTTON, M; GREENWOOD, J. C et al.Surface and interface analysis. 1993, Vol 20, Num 12, pp 984-990, issn 0142-2421Article

Simultaneous angle-resolved measurement of the band structure of single-crystal graphite by an improved two-dimensional display analyzerNISHIMOTO, H; DAIMON, H; SUGA, S et al.Review of scientific instruments. 1993, Vol 64, Num 10, pp 2857-2862, issn 0034-6748Article

Quelques aspects de la spectrométrie des dileptons aux énergies intermédiaires = Few aspects of dilepton spectrometry at intermediate energiesManso, Franck; Roche, Guy.1993, 142 p.Thesis

Electron energy spectra for different angles of passage of fission fragments through thin aluminum oxide filmsRYKOV, V. A.Atomic energy (New York, N.Y.). 1997, Vol 83, Num 3, pp 667-670, issn 1063-4258Article

Evaluation of AES depth profiles of thin-film systems by application of novel graphically interactive factor analysis softwareSCHEITHAUER, U; HÖSLER, W; RIEDL, G et al.Surface and interface analysis. 1993, Vol 20, Num 6, pp 519-523, issn 0142-2421Article

Sloping Shirley-type inelastic line shapesVEGH, J.Surface and interface analysis. 1993, Vol 20, Num 10, pp 860-862, issn 0142-2421Article

The effect of energy-dependent detector efficiency in electron spectroscopic methods : XPS, AES and DCEMSKAJCSOS, Z; MEISEL, W; GRIESBACH, P et al.Surface and interface analysis. 1993, Vol 20, Num 6, pp 544-548, issn 0142-2421Article