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New concept of information resolution in scanning electron microscope imagesISHITANI, T; SATO, M.Ultramicroscopy. 2000, Vol 84, Num 3-4, pp 199-211, issn 0304-3991Article

Lie algebra deflection aberration theory for magnetic deflection systemsHU KANGYAN; TANG, T.-T.Optik (Stuttgart). 1999, Vol 110, Num 1, pp 9-16, issn 0030-4026Article

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Reply to Rebuttal of 'The relationship of lens aberrations to image aberrations in electron optics' by P.W. HawkesREMPFER, G. F.Optik (Stuttgart). 1999, Vol 110, Num 8, pp 375-377, issn 0030-4026Article

The relationship of lens aberrations to image aberrations in electron opticsREMPFER, G. F.Optik (Stuttgart). 1999, Vol 110, Num 1, pp 17-24, issn 0030-4026Article

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