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Interface smoothing of soft x-ray Mo/Y multilayer mirror by thermal treatmentGUPTA, P; TENKA, T. P; RAI, S et al.Journal of physics. D, Applied physics (Print). 2007, Vol 40, Num 21, pp 6684-6689, issn 0022-3727, 6 p.Article

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Determination of porosity of mesoporous silica thin films by quantitative X-ray reflectivity analysis and GISAXSDOURDAIN, S; MEHDI, A; BARDEAU, J. F et al.Thin solid films. 2006, Vol 495, Num 1-2, pp 205-209, issn 0040-6090, 5 p.Conference Paper

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A complex x-ray characterization of epitaxially grown high-K gate dielectricsZAUMSEIL, P; SCHROEDER, T.Journal of physics. D, Applied physics (Print). 2005, Vol 38, Num 10A, pp A179-A183, issn 0022-3727Conference Paper

Tailoring of multilayer interfaces by pulsed laser irradiationLUBY, S; MAJKOVA, E.Applied surface science. 2005, Vol 248, Num 1-4, pp 316-322, issn 0169-4332, 7 p.Conference Paper

Splitting of X-ray diffraction peak in (Ge:SiO₂)/SiO₂ multilayersLI, J; WU, X. L; HU, D. S et al.Solid state communications. 2004, Vol 131, Num 1, pp 21-25, issn 0038-1098, 5 p.Article

Automated metrology system including VUV spectroscopic ellipsometry and X-ray reflectometry for 300 mm silicon microelectronicsBOHER, P; EVRARD, P; CONDAT, O et al.Thin solid films. 2004, Vol 450, Num 1, pp 114-119, issn 0040-6090, 6 p.Conference Paper

Recent advances in characterization of ultra-thin films using specular X-ray reflectivity techniqueBANERJEE, S; FERRARI, S; CHATEIGNER, D et al.Thin solid films. 2004, Vol 450, Num 1, pp 23-28, issn 0040-6090, 6 p.Conference Paper

Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratingsMIKULIK, P; JERGEL, M; BAUMBACH, T et al.Journal of physics. D, Applied physics (Print). 2001, Vol 34, Num 10A, pp A188-A192, issn 0022-3727Article

The Collaborative Computational Project on surfaces : CCP3GRIMLEY, T. B; INGLESFIELD, J. E.Computer physics communications. 2001, Vol 137, Num 1, pp 1-3, issn 0010-4655Article

Study of thin film multilayers using X-ray reflectivity and scanning probe microscopyBANERJEE, S; DATTA, A; SANYAL, M. K et al.Vacuum. 2001, Vol 60, Num 4, pp 371-376, issn 0042-207XConference Paper

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Analysis methods in neutron and X-ray reflectometry : Scattering, reflection and surface interactionsLOVELL, M. R; RICHARDSON, R. M.Current opinion in colloid & interface science. 1999, Vol 4, Num 3, pp 197-204, issn 1359-0294Article

X-ray and neutron reflectivityTOLAN, M; PRESS, W.Zeitschrift für Kristallographie. 1998, Vol 213, Num 6, pp 319-336, issn 0044-2968Article

Information on in-and out-of-plane correlated roughness in multilayers from x-ray specular reflectivityROMANOV, V. P; ULYANOV, S. V; UZDIN, V. M et al.Journal of physics. D, Applied physics (Print). 2008, Vol 41, Num 11, issn 0022-3727, 115401.1-115401.7Article

Co-refinement of multiple-contrast neutron/X-ray reflectivity data using MOTOFITNELSON, Andrew.Journal of applied crystallography. 2006, Vol 39, pp 273-276, issn 0021-8898, 4 p., 2Article

Hard X-ray surface modes of a periodic multilayerPRUDNIKOV, I. R.Journal of applied crystallography. 2006, Vol 39, pp 259-261, issn 0021-8898, 3 p., 2Article

Influence of surfactant Ag on the structure of annealing Ni₇₀Co₃₀/Cu multilayers by X-ray reflection anomalous fine structure and X-ray absorption spectroscopyAN, Y. K; ZHANG, H. D; MAI, Z. H et al.Physica. B, Condensed matter. 2006, Vol 382, Num 1-2, pp 193-200, issn 0921-4526, 8 p.Article

Energy dispersive x-ray reflectometry as a unique laboratory tool for investigating morphological properties of layered systems and devicesALBERTINI, V. Rossi; PACI, B; GENEROSI, A et al.Journal of physics. D, Applied physics (Print). 2006, Vol 39, Num 23, issn 0022-3727, R461-R486Article

Electron density profile at the interface of SiO₂/Si(0 01)BANERJEE, S; FERRARI, S; PIAGGE, R et al.Applied surface science. 2006, Vol 253, Num 1, pp 17-20, issn 0169-4332, 4 p.Conference Paper