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Chemical synthesis of nanocrystalline SnO₂ thin films for supercapacitor applicationPUSAWALE, S. N; DESHMUKH, P. R; LOKHANDE, C. D et al.Applied surface science. 2011, Vol 257, Num 22, pp 9498-9502, issn 0169-4332, 5 p.Article

Structural analysis of the natural clinker-based analcime (NC-ANA) by X-ray powder diffraction and solid-state ²⁹Si and ²⁷al nuclear magnetic resonance spectroscopyMACIAS LOPEZ, Mario Alberto; HENAO MARTINEZ, José Antonio; RIOS REYES, Carlos Alberto et al.Revista Facultad de Ingeniería Universidad de Antioquia. 2011, Num 61, pp 9-18, issn 0120-6230, 10 p.Article

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Determination of the absolute chirality of tellurium using resonant diffraction with circularly polarized x-raysTANAKA, Y; COLLINS, S. P; LOVESEY, S. W et al.Journal of physics. Condensed matter (Print). 2010, Vol 22, Num 12, issn 0953-8984, 122201.1-122201.7Article

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High-performance copper alloy films for barrierless metallizationLIN, C. H; LEAU, W. K; WU, C. H et al.Applied surface science. 2010, Vol 257, Num 2, pp 553-557, issn 0169-4332, 5 p.Article

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Anisotropic characteristics of a-plane GaN films grown on γ-LiAlO₂ (3 0 2) substrates by MOCVDTINGTING JIA; SHENGMING ZHOU; KE XU et al.Applied surface science. 2010, Vol 257, Num 4, pp 1181-1184, issn 0169-4332, 4 p.Article