Bases bibliographiques Pascal et Francis

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Local structure determination for benzene/NO coadsorption on Ni(111) using scanned-energy mode photoelectron diffractionBAO, S; LINDSAY, R; WOODRUFF, D. P et al.Surface science. 2001, Vol 478, Num 1-2, pp 35-48, issn 0039-6028Article

Photoelectron diffraction determination of the local adsorption geometry of CO on Cu(210)TERBORG, R; POLCIK, M; TOOMES, R. L et al.Surface science. 2001, Vol 473, Num 3, pp 203-212, issn 0039-6028Article

Computation of photo-electron and Auger-electron diffraction. II. Multiple scattering cluster calculation PAD2HARP, G. R; UEDA, Y; CHEN, X et al.Computer physics communications. 1998, Vol 112, Num 1, pp 80-90, issn 0010-4655Article

Imaging scatterer planes by photoelectron diffractionSEELMANN-EGGEBERT, M.Surface science. 1997, Vol 377-79, pp 1094-1100, issn 0039-6028Conference Paper

Adsorbate structure determination using photoelectron diffraction : Methods and applicationsWOODRUFF, D. P.Surface science reports. 2007, Vol 62, Num 1, pp 1-38, issn 0167-5729, 38 p.Article

Direct surface-structure analysis by the peak rotation in circularly polarized light photoelectron diffractionDAIMON, Hiroshi; IMADA, Shin; SUGA, Shigemasa et al.Surface science. 2001, Vol 471, Num 1-3, pp 143-150, issn 0039-6028Article

ETUDE DE LA CROISSANCE DE MÉTAUX SUR OXYDES PAR DIFFRACTION DE PHOTOÉLECTRONS A HAUTE ÉNERGIE CINÉTIQUE : CAS DE L'ARGENT ET DU FER SUR LA SURFACE (001) DE L'OXYDE DE MAGNÉSIUM = GROWTH OF METAL ON OXIDES STUDIED BY HIGH ENERGY PHOTOELECTRON DIFFRACTION : THE CASE OF SILVER AND IRON ON MgO(001) SURFACEAssi, Kondo Claude; Jézéquel, Guy.2000, 190 p.Thesis

High-resolution inverted x-ray photoelectron diffraction studies of Si(100)EVANS, S.Journal of physics. Condensed matter (Print). 1997, Vol 9, Num 9, pp 1967-1982, issn 0953-8984Article

Apport des techniques de photoémission à la connaissance des hétérostructures Ge/Si(001), Si/Ge(001), Si1-xGex/Si(001) et Si1-xGex/Ge(001) = Contribution of in-situ photoemission techniques to the knowledge of Ge/Si(001), Si/Ge(001), Si1-xGex/Si(001), Si1-xGex/Ge(001) heterostructuresAubel, Dominique; Kubler, L.1995, 204 p.Thesis

Photoelectron diffraction : from phenomenological demonstration to practical toolWOODRUFF, D. P.Applied physics. A, Materials science & processing (Print). 2008, Vol 92, Num 3, pp 439-445, issn 0947-8396, 7 p.Conference Paper

The photoelectron diffraction technique applied to advanced materialsTEJEDA, Antonio; MICHEL, Enrique G.Journal of physics. Condensed matter (Print). 2004, Vol 16, Num 33, pp S3441-S3450, issn 0953-8984Conference Paper

Determining adsorbate structures from substrate emission X-ray photoelectron diffractionMUNTWILER, Matthias; AUWÄRTER, Willi; BAUMBERGER, Felix et al.Surface science. 2001, Vol 472, Num 1-2, pp 125-132, issn 0039-6028Article

Photoelectron diffraction study of the Ag(110)-(2 x 1)-O reconstructionPASCAL, M; LAMONT, C. L. A; BAUMGÄRTEL, P et al.Surface science. 2000, Vol 464, Num 2-3, pp 83-90, issn 0039-6028Article

Combined photoelectron and X-ray diffraction from ultrathin Fe films on Cu3Au(001)BRUNO, F; CVETKO, D; CANEPA, M et al.Applied surface science. 2000, Vol 162-63, pp 340-345, issn 0169-4332Conference Paper

Elastic scattering of Si 2p photoelectrons in silicon oxideHATTORI, T; HIROSE, K; NOHIRA, H et al.Applied surface science. 1999, Vol 144-45, pp 297-300, issn 0169-4332Conference Paper

Photoelectron diffraction determination of the structure of the Cu(100)c(2×2)-Mn surface phaseTOOMES, R; THEOBALD, A; LINDSAY, R et al.Journal of physics. Condensed matter (Print). 1996, Vol 8, Num 49, pp 10231-10240, issn 0953-8984Article

Surface and interface structural analysis of VOX/TiO2 (110) by X-ray photoelectron diffractionMIYASAKA, Shinya; AMANO, Kentaro; NOJIMA, Masashi et al.Surface and interface analysis. 2008, Vol 40, Num 13, pp 1650-1654, issn 0142-2421, 5 p.Conference Paper

Global search in photoelectron diffraction structure determination using genetic algorithmsVIANA, M. L; DIEZ MUINO, R; SOARES, E. A et al.Journal of physics. Condensed matter (Print). 2007, Vol 19, Num 44, issn 0953-8984, 446002.1-446002.14Article

Determination of 3D atomic structure of surfaces and interfaces by photoelectron holographyNIHEI, Yoshimasa.Surface and interface analysis. 2003, Vol 35, Num 1, pp 45-50, issn 0142-2421, 6 p.Article

Sb/Si(1 1 0) 2 x 3: a photoelectron diffraction studySCHÜRMANN, M; DREINER, S; BERGES, U et al.Applied surface science. 2003, Vol 212-13, pp 131-134, issn 0169-4332, 4 p.Conference Paper

Photoelectron holography analysis of W(1 1 0)(1 × 1)-O surfaceTAKAGI, Hiroshi; DAIMON, Hiroshi; PALOMARES, F. Javier et al.Surface science. 2001, Vol 470, Num 3, pp 189-196, issn 0039-6028Article

The role of the Si-suboxide structure at the interface: an angle-scanned photoelectron diffraction studyWESTPHAL, C; DREINER, S; SCHÜRMANN, M et al.Thin solid films. 2001, Vol 400, Num 1-2, pp 101-105, issn 0040-6090Conference Paper

Site-specific extinction rule for Kikuchi bands in X-ray photoelectron diffractionOMORI, S; ISHII, H; NIHEI, Y et al.Japanese journal of applied physics. 1997, Vol 36, Num 12B, pp L1689-L1691, issn 0021-4922, 2Article

Site-specific characteristic of the Kikuch-like bands in high-angular-resolution X-ray photoelectron diffractionICHINOHE, Y; ISHII, H; OWARI, M et al.Japanese journal of applied physics. 1996, Vol 35, Num 5A, pp L587-L590, issn 0021-4922, 2Article

Correlation expansion : a powerful alternative multiple scattering calculation methodHAIFENG ZHAO; SEBILLEAU, Didier; ZIYU WU et al.Journal of physics. Condensed matter (Print). 2008, Vol 20, Num 27, issn 0953-8984, 275241.1-275241.10Article

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