Mapping of chemical bonding states of Ag/Si(111) with synchrotron radiation photo emission electron microscopyHASHIMOTO, M; GUO, F.-Z; SAITO, Y et al.Surface and interface analysis. 2008, Vol 40, Num 13, pp 1772-1776, issn 0142-2421, 5 p.Conference Paper

Application de l'analyse de surface par XPS (Spectrométrie de Photoélectrons X) dans un domaine industriel: L'automobile = Industrial XPS surface analysis : Automobile industryDELALANDE, Stéphane.Le Vide (1995). 2003, Vol 58, Num 308, pp 334-352, issn 1266-0167, 19 p.Article

Effect of focused X-rays on micrometer-thick insulating layers in scanning photoelectron microscopySHIN, H. J; LEE, M. K; KIM, G. B et al.Journal de physique. IV. 2003, Vol 104, pp 463-466, issn 1155-4339, 4 p.Conference Paper

Ancient surfaces in thought and realityPAPARAZZO, Ernesto.Surface and interface analysis. 2011, Vol 43, Num 8, pp 1100-1107, issn 0142-2421, 8 p.Article

Initial oxidation of HF-acid treated SiGe(100) surfaces under air exposure investigated by synchrotron radiation X-ray photoelectron spectroscopy and IR absorption spectroscopyNARITA, Yuzuru; HIROSE, Fumihiko; NAGATO, Masaya et al.Thin solid films. 2008, Vol 517, Num 1, pp 209-212, issn 0040-6090, 4 p.Conference Paper

Spectroscopie Auger :Imagerie et profil en z. Applications = Auger spectroscopy : imaging and depth profile. ApplicationsCAZAUX, Jacques.Techniques de l'ingénieur. Analyse et caractérisation. 2007, Vol TA3, Num P2621v2, issn 1762-8717, P2621v2.1-P2621v2.13Article

Application de la spectroscopie XPS dans le contrôle de surface de matériau polymérique = Use of XPS for the study of polymeric surfacesHUIBAN, Yvon; LYNCH, John.Le Vide (1995). 2003, Vol 58, Num 308, pp 316-323, issn 1266-0167, 8 p.Article

The mechanisms of pyrite oxidation and leaching: A fundamental perspectiveCHANDRA, A. P; GERSON, A. R.Surface science reports. 2010, Vol 65, Num 9, pp 293-315, issn 0167-5729, 23 p.Article

Effect of composition inhomogeneity in a-Sio_xN_y thin films on their optical propertiesREBIB, Farida; TOMASELLA, Eric; MICHELI, Victor et al.Optical materials (Amsterdam). 2009, Vol 31, Num 3, pp 510-513, issn 0925-3467, 4 p.Conference Paper

Angle-resolved XPS structural investigation of GaAs surfacesNEGRILA, C. C; LOGOFATU, C; GHITA, R. V et al.Journal of crystal growth. 2008, Vol 310, Num 7-9, pp 1576-1582, issn 0022-0248, 7 p.Article

Practical Surface Treatments and Surface Chemistry of n-Type and p-Type GaNUHLRICH, J. J; GRABOW, L. C; MAVRIKAKIS, M et al.Journal of electronic materials. 2008, Vol 37, Num 4, pp 439-447, issn 0361-5235, 9 p.Article

Spectromicroscopic study of bimetal/semiconductor interfaces by synchrotron lightKOVAD, Janez.Vacuum. 2003, Vol 71, Num 1-2, pp 3-10, issn 0042-207X, 8 p.Conference Paper

Calculations of Auger intensity versus beam position for a sample with layers perpendicular to its surfaceZOMMER, L; JABLONSKI, A.Journal of physics. D, Applied physics (Print). 2010, Vol 43, Num 27, issn 0022-3727, 275301.1-275301.7Article

Recent progress in energy-filtered high energy X-ray photoemission electron microscopy using a Wien filter type energy analyzerNIIMI, H; TSUTSUMI, T; MATSUDAIRA, H et al.Applied surface science. 2004, Vol 237, Num 1-4, pp 641-644, issn 0169-4332, 4 p.Conference Paper

Surface adsorbed atoms suppressing hydrogen permeation of Pd membranesYAMAKAWA, Kohji; EGE, Michael; LUDESCHER, Bernd et al.Journal of alloys and compounds. 2003, Vol 352, pp 57-59, issn 0925-8388, 3 p.Article

Spectroscopie des électrons Auger (AES) et spectroscopie de photoélectrons (XPS): principe et applications = Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) : Theory and applicationBARTHES-LABROUSSE, Marie-Geneviève.Le Vide (1995). 2003, Vol 58, Num 308, pp 353-362, issn 1266-0167, 10 p.Article

XPS et surfaces métalliques : surfaces d'alliages, oxydation, corrosion et traitements de surface = XPS and metallic surfaces : Alloys surfaces, oxidation, corrosion and surface treatmentsMARCUS, Philippe; GALTAYRIES, Anouk.Le Vide (1995). 2003, Vol 58, Num 308, pp 230-255, issn 1266-0167, 26 p.Article

Imaging of patterned self-assembled monolayers by scanning photoelectron microscopyKLAUSER, R; ZHARNIKOV, M; HONG, I.-H et al.Journal de physique. IV. 2003, Vol 104, pp 459-462, issn 1155-4339, 4 p.Conference Paper

Excimer laser etching process of CdTe crystals for formation of deep vertical trenchesYASUDA, K; NIRAULA, M; NAKAMURA, K et al.Journal of electronic materials. 2007, Vol 36, Num 8, pp 837-840, issn 0361-5235, 4 p.Conference Paper

Rapid tarnishing of silver nanoparticles in ambient laboratory airMCMAHON, M. D; LOPEZ, R; MEYER, H. M et al.Applied physics. B, Lasers and optics (Print). 2005, Vol 80, Num 7, pp 915-921, issn 0946-2171, 7 p.Article

Surface analyses of Zr (film)/4H-SiC (substrate) by synchrotron radiation induced-PEEMKAMEZAWA, C; HIRAI, M; KUSAKA, M et al.Applied surface science. 2004, Vol 237, Num 1-4, pp 611-615, issn 0169-4332, 5 p.Conference Paper

Etude XPS de céramiques et de verres = XPS study of ceramics and glassGAUTIER-SOYER, Martine.Le Vide (1995). 2003, Vol 58, Num 308, pp 256-281, issn 1266-0167, 26 p.Article

L'XPS et les catalyseurs = XPS and catalystsGENGEMBRE, Léon.Le Vide (1995). 2003, Vol 58, Num 308, pp 282-315, issn 1266-0167, 34 p.Article

Photoelectrochemical imaging of non-planar surfaces: the influence of geometrical and optical factors on image formationMAFFI, S; LENARDI, C; BOZZINI, B et al.Measurement science & technology (Print). 2002, Vol 13, Num 9, pp 1398-1403, issn 0957-0233, 6 p.Article

Photoelectron microscopyBAUER, E.Journal of physics. Condensed matter (Print). 2001, Vol 13, Num 49, pp 11391-11404, issn 0953-8984Article