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The maximum-entropy method in charge-density studies : aspects of reliabilityJAUCH, W; PALMER, A.Acta crystallographica. Section A, Foundations of crystallography. 1993, Vol 49, pp 590-591, issn 0108-7673, 3Article

The videographic method : a new procedure for the simulation and reconstruction of real structuresRAHMAN, S. H.Acta crystallographica. Section A, Foundations of crystallography. 1993, Vol 49, pp 56-68, issn 0108-7673, 1Article

On the mapping of electrostatic properties from the multipole description of the charge densityZHENGWEI SU; COPPENS, P.Acta crystallographica. Section A, Foundations of crystallography. 1992, Vol 48, pp 188-197, issn 0108-7673, 2Article

Scanning tunneling microscopy of the organic conductor [(η-C₅Me₅)₂Ru(η⁶,η⁶-[2₂](1,4)-cyclophane)][TCNQ]₄LI, S; CHITE, H. S; WARD, M. D et al.Chemistry of materials. 1992, Vol 4, Num 5, pp 1082-1091, issn 0897-4756Article

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Coordination and Valence of niobium in TiO₂-NbO₂ solid solutions through X-ray absorption spectroscopyANTONIO, M. R; INHO SONG; YAMADA, H et al.Journal of solid state chemistry (Print). 1991, Vol 93, Num 1, pp 183-192, issn 0022-4596Article

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On the Pr_nO_2n-2 series of oxides and the structure of Pr₂₄O₄₄ : an investigation by high-resolution electron microscopySCHWEDA, E; BEVAN, D. J. M; EYRING, L et al.Journal of solid state chemistry (Print). 1991, Vol 90, Num 1, pp 109-125, issn 0022-4596Article

The mechanism of atomic emission at a hotspot and its application to the on-line analysis of molten ironCHIBA, K; ONO, A; SAEKI, M et al.Tetsu-to-hagané. 1991, Vol 77, Num 11, pp 1874-1880, issn 0021-1575Article

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Further statistical analysis of the composition of a Σ=9/=(-1,-14)grain boundary in a Mo(Re) alloy studied by atom-probe field-ion microscopyUDLER; HU, J. H; KUO, S.-M et al.Scripta metallurgica et materialia. 1991, Vol 25, Num 4, pp 841-845Article

Preferential sputtering of B studied by low-energy ion scattering using the dual-isotope surface composition (disc) methodACKERMANS, P. A. J; CREUWELS, M. A. P; BRONGERSMA, H. H et al.Surface science. 1990, Vol 227, Num 3, pp 361-368, issn 0039-6028, 8 p.Article

Unique ion beam scattering technique on depth profile determinationFINK, D; FICHTNER, P. F. P.Radiation effects and defects in solids. 1990, Vol 114, Num 4, pp 337-341, issn 1042-0150, 5 p.Article

Some phonon effects in S(q) for bcc metalsROSENFELD, A. M; STOTT, M. J.Physical review. B, Condensed matter. 1990, Vol 42, Num 11, pp 6963-6972, issn 0163-1829Article

Structural modifications induced by proton exchange in γ-LiFeO₂BARRIGA, C; MORALES, J; TIRADO, J. L et al.Materials research bulletin. 1990, Vol 25, Num 8, pp 997-1002, issn 0025-5408Article

reflectance-difference detection of growth oscillationsPAULSSON, G; DEPPERT, K; JEPPESEN, S et al.Journal of crystal growth. 1990, Vol 105, Num 1-4, pp 312-315, issn 0022-0248Conference Paper

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Parallel-processing single-beam Fourier-imaging thermal-wave microscopes: line-heating systemsLORINCZ, A.Journal of applied physics. 1988, Vol 64, Num 9, pp 4342-4346, issn 0021-8979Article

EMS, a software package for electron diffraction analysis and HREM image simulation in materials scienceSTADELMANN, P. A.Ultramicroscopy. 1987, Vol 21, Num 2, pp 131-146, issn 0304-3991Article

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Dynamic effects of pair correlation functions on spin relaxation by translational diffusion in two-dimensional fluidsKORB, J.-B; AHADI, M; ZIENTARA, G. P et al.The Journal of chemical physics. 1987, Vol 86, Num 3, pp 1125-1130, issn 0021-9606Article

Measurement of atomic mean square displacement in Si-Ge solid solutions by critical voltage methodEGUCHI, T; TOMOKIYO, Y; MATSUHATA, H et al.Journal de microscopie et de spectroscopie électroniques. 1987, Vol 12, Num 6, pp 559-568, issn 0395-9279Article