Phase transitions at interfacesBerichte der Bunsen-Gesellschaft. 1994, Vol 98, Num 3, issn 0940-483XConference Proceedings

Adsorption and multilayer growth of thiophene on crystalline and amorphous iceHABERKERN, H; HAQ, S; SWIDEREK, P et al.Surface science. 2001, Vol 490, Num 1-2, pp 160-174, issn 0039-6028Article

Disjoining pressure of planar adsorbed filmsHENDERSON, J. R.The European physical journal. Special topics. 2011, Vol 197, pp 115-124, issn 1951-6355, 10 p.Article

Classification and general derivation of interfacial forces, acting on phases, situated in the bulk, or at the interface of other phasesKAPTAY, G.Journal of materials science. 2005, Vol 40, Num 9-10, pp 2125-2131, issn 0022-2461, 7 p.Conference Paper

Atomic Property Weighted Radial Distribution Functions Descriptors of Metal―Organic Frameworks for the Prediction of Gas Uptake CapacityFERNANDEZ, Michael; TREFIAK, Nicholas R; WOO, Tom K et al.Journal of physical chemistry. C. 2013, Vol 117, Num 27, pp 14095-14105, issn 1932-7447, 11 p.Article

Competitive Anion/Water and Cation/Water Interactions at Electrified Copper/Electrolyte Interfaces Probed by in Situ X-ray DiffractionKELLER, Hubert; SARACINO, Martino; NGUYEN, Hai M.T et al.Journal of physical chemistry. C. 2012, Vol 116, Num 20, pp 11068-11076, issn 1932-7447, 9 p.Article

Initial state dependence of interface dynamics in a reaction-diffusion systemHIDA, Masaki; HONDA, Katsuya.Journal of the Physical Society of Japan. 2003, Vol 72, Num 10, pp 2690-2691, issn 0031-9015, 2 p.Article

X-ray diffraction analysis of GaAs/AlAs multilayer structures grown by molecular beam epitaxy on (311) and (210) GaAs sufacesTAGLIENTE, M. A; DE CARO, L; NÖTZEL, R et al.Solid-state electronics. 1994, Vol 37, Num 4-6, pp 747-751, issn 0038-1101Conference Paper

Electron desorption study of HF etched Si(100)CRAIG, J. H; CARISS, C; CRAIG, M. J et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 3, pp 554-556, issn 0734-2101Article

Low-energy ion-scattering study of the oxygen-induced reconstructed p(2×1) and c(6×2) surfaces of Cu(110)DORENBOS, G; BREEMAN, M; BOERMA, D. O et al.Physical review. B, Condensed matter. 1993, Vol 47, Num 3, pp 1580-1588, issn 0163-1829Article

Preparation of carbon nanotubes by arc-discharge evaporationANDO, Y; IIJIMA, S.Japanese journal of applied physics. 1993, Vol 32, Num 1A/B, pp L107-L109, issn 0021-4922, 2Article

Increased modulation depth of submicron gratings produced by photoelectrochemical etching of GaAsTWYFORD, E. J; KOHL, P. A; JOKERST, N. M et al.Applied physics letters. 1992, Vol 60, Num 20, pp 2528-2530, issn 0003-6951Article

Measuring the thickness of oxide on polysilicon using ultraviolet ellipsometryTOMPKINS, H. G; VASQUEZ, B; MATHIS, T et al.Journal of the Electrochemical Society. 1992, Vol 139, Num 6, pp 1772-1777, issn 0013-4651Article

Scanning tunneling microscopy studies of diamond-like films prepared by laser ablationVASQUEZ, L; MARTIN-GAGO, J. A; BERNARD, P et al.Materials science & engineering. B, Solid-state materials for advanced technology. 1992, Vol 11, Num 1-4, pp 363-367Conference Paper

Formation of semiconductor interfaces by surfaces electromigrationYASUNAGA, H; NATORI, A; WU, N.-J et al.Applied surface science. 1992, Vol 56-58, pp 330-334, issn 0169-4332, aConference Paper

Semiconducting silicide-silicon heterostructures : growth, properties and applicationsDERRIEN, J; CHEVRIER, J; LE THANH, V et al.Applied surface science. 1992, Vol 56-58, pp 382-393, issn 0169-4332, aConference Paper

Study of the surface morphology and growth mode of in situ ion-beam sputter-deposited YBa₂Cu₃O_77-δ thin filmsLICHTENWALNER, D. J; AUCIELLO, O; WOOLCOTT, R. R et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1992, Vol 10, Num 4, pp 1537-1543, issn 0734-2101, 2Conference Paper

Si(111) and Si(100) surfaces observed in air by scanning tunneling microscopyCRICENTI, A; SELCI, S; SCARSELLI, M et al.Applied surface science. 1992, Vol 56-58, pp 34-38, issn 0169-4332, aConference Paper

Thermal stability and degradation mechanisms of trialkylsilyl surface modification on silica powderSEVERIN, J. W; VAN DER WEL, H; CAMPS, I. G. J et al.Surface and interface analysis. 1992, Vol 19, Num 1-12, pp 133-138, issn 0142-2421Conference Paper

1/f noise for driven interfacesKRUG, J.Physical review. A. 1991, Vol 44, Num 2, pp R801-R804, issn 1050-2947Article

A transmission electron microscopy study of hillocks in thin aluminum filmsERICSON, F; KRISTENSEN, N; SCHWEITZ, J.-A et al.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1991, Vol 9, Num 1, pp 58-63, issn 0734-211XArticle

Atom condensation on an atomically smooth surface : Ir, Re, W, and Pd on Ir(111)WANG, S. C; EHRLICH, G.The Journal of chemical physics. 1991, Vol 94, Num 5, pp 4071-4074, issn 0021-9606Article

Desorption kinetics of hydrogen from the Si(111)7×7 surfaceREIDER, G. A; HÖFER, U; HEINZ, T. F et al.The Journal of chemical physics. 1991, Vol 94, Num 5, pp 4080-4083, issn 0021-9606Article

Development of techniques for real-time monitoring and control in plasma etching. I, Response surface modeling of CF₄/O₂ and CF₄/H₂ etching of silicon and silicon dioxideMCLAUGHLIN, K. J; BUTLER, S. W; EDGAR, T. F et al.Journal of the Electrochemical Society. 1991, Vol 138, Num 3, pp 789-799, issn 0013-4651Article

Generic scale invariance and roughening in noisy model sandpiles and other driven interfacesGRINSTEIN, G; LEE, D.-L.Physical review letters. 1991, Vol 66, Num 2, pp 177-180, issn 0031-9007Article