Phononic heat transfer across an interface: thermal boundary resistancePERSSON, B. N. J; VOLOKITIN, A. I; UEBA, H et al.Journal of physics. Condensed matter (Print). 2011, Vol 23, Num 4, issn 0953-8984, 045009.1-045009.12Article

Fractal Model for Thermal Contact ConductanceMINGQING ZOU; BOMING YU; JIANCHAO CAI et al.Journal of heat transfer. 2008, Vol 130, Num 10, issn 0022-1481, 101301.1-101301.9Article

Comment on: Chemical reactivity of alkali-semiconductor interfaces: the case of K/GaAs(110) and K/Si(100) interfaces by M.C.G. Passeggi Jr. et alSIUDA, R.Surface science. 1998, Vol 395, Num 1, pp 10-11, issn 0039-6028Article

Epitaxial composite layered Co/Fe and Ni/Fe single crystalsMUSHAILOV, E. S.Physics of metals and metallography. 1998, Vol 85, Num 6, pp 666-669, issn 0031-918XArticle

On a simplified analysis of the carrier contribution to the elastic constants in semiconductor superlattices in the presence of crossed electric and quantizing magnetic fieldsGHATAK, K. P; BASU, D. K; NAG, B et al.The Journal of physics and chemistry of solids. 1997, Vol 58, Num 1, pp 133-138, issn 0022-3697Article

Capillary instabilities in polycrystalline metallic foils : experimental observations of thermal pitting in nickelGENIN, F. Y; MULLINS, W. W; WYNBLATT, P et al.Acta metallurgica et materialia. 1994, Vol 42, Num 4, pp 1489-1492, issn 0956-7151Article

Heating of metal/ceramic foils in an electron microscopeSHOUXIN LI; GE YAO; YANDONG TANG et al.Scripta metallurgica et materialia. 1994, Vol 30, Num 12, pp 1547-1552, issn 0956-716XArticle

Thermal diffusivity measurement of GaAs/AlGaAs thin-film structureCHEN, G; TIEN, C. L; WU, X et al.Journal of heat transfer. 1994, Vol 116, Num 2, pp 325-331, issn 0022-1481Article

An analytical calculation of the nonstationary thermal conductivity of multilayered bodiesKALITVYANSKII, V. L.High temperature. 1993, Vol 31, Num 3, issn 0018-151X, p. 618Article

DSC, X-ray and magnetic studies on electroless Ni-P films grown in alkaline ethanolamine bathsRAJAM, K. S; INDIRA RAJAGOPAL; RAJAGOPALAN, S. R et al.Materials chemistry and physics. 1993, Vol 33, Num 3-4, pp 289-297, issn 0254-0584Article

Some remarks on the use of SHG in nickel surface roughness inspectionPEIPONEN, K.-E; SILFSTEN, P; RIIHOLA, P et al.Optik (Stuttgart). 1993, Vol 94, Num 4, pp 177-179, issn 0030-4026Article

X-ray induced modification of metal/fluoropolymer interfacesMING-KUN SHI; LAMONTAGNE, B; MARTINU, L et al.Journal of applied physics. 1993, Vol 74, Num 3, pp 1744-1746, issn 0021-8979Article

Reduction of solid-solid thermal boundary resistance by inserting an interlayerZHI LIANG; TSAI, Hai-Lung.International journal of heat and mass transfer. 2012, Vol 55, Num 11-12, pp 2999-3007, issn 0017-9310, 9 p.Article

Ultrathin magnesia films as support for molecules and metal clusters: Tuning reactivity by thickness and compositionVAIDA, Mihai E; BERNHARDT, Thorsten M; BARTH, Clemens et al.Physica status solidi. B. Basic research. 2010, Vol 247, Num 5, pp 1001-1015, issn 0370-1972, 15 p.Article

Heat transfer between graphene and amorphous SiO₂PERSSON, B. N. J; UEBA, H.Journal of physics. Condensed matter (Print). 2010, Vol 22, Num 46, issn 0953-8984, 462201.1-462201.6Article

Calculation of interfacial tension based on sub-lattice model and thermodynamic dataKANG, L. T; QIAO, Z. Y; YUAN, B. Y et al.Calphad. 2003, Vol 27, Num 1, pp 57-64, issn 0364-5916, 8 p.Article

Structural, optical and electrical properties of undoped and indium doped zinc oxide prepared by spray pyrolysisADDOU, M; MOUMIN, A; EL IDRISSI, B et al.Journal de chimie physique. 1999, Vol 96, Num 2, pp 232-244, issn 0021-7689Article

A method to determine the contact areas of clusters deposited on a semiconducting substrateGERLACH, E.Physica status solidi. A. Applied research. 1999, Vol 176, Num 2, pp 937-942, issn 0031-8965Article

Correlation between the adhesion and the thermal contact resistance : effects of substrate surface ion bombardment etchingLAHMAR, A; HMINA, N; SCUDELLER, Y et al.Thin solid films. 1998, Vol 325, Num 1-2, pp 156-162, issn 0040-6090Article

Thermal interface resistance and subsurface effusivity of submicron metallic films on dielectric substrates : an experimental method for simultaneous determinationHMINA, N; SCUDELLER, Y.International journal of heat and mass transfer. 1998, Vol 41, Num 18, pp 2781-2798, issn 0017-9310Article

Réactivité locale de surfaces de silicium (111). Etude par microscopie à effet tunnel = Local physical and chemical properties of silicon (111) surfaces. A scanning tunneling microscopy studyRoche, Jean-Robert; Salvan, F.1996, 111 p.Thesis

The surface and interface reaction of metal thin film on sapphire substrateKANG, H. J; KIM, C. H; PARK, N. S et al.Applied surface science. 1996, Vol 100-01, pp 160-164, issn 0169-4332Conference Paper

IR spectroscopic study of SO2 adsorption on polysiloxane layers containing tertiary amino groupsVASILJEVA, L. L; DULTSEV, F. N; MILEKHIN, A. H et al.Thin solid films. 1995, Vol 261, Num 1-2, pp 296-298, issn 0040-6090Article

Interfacial shear strength of diamond-like carbon coatings deposited on metalsBENTZON, M. D; BARHOLM-HANSEN, C; HANSEN, J. B et al.Diamond and related materials. 1995, Vol 4, Num 5-6, pp 787-790, issn 0925-9635Conference Paper

New trends in analytical tribologyMARTIN, J. M; BELIN, M.Thin solid films. 1993, Vol 236, Num 1-2, pp 173-179, issn 0040-6090Conference Paper