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Thickening of thin laser crystallized silicon films by solid phase epitaxy for photovoltaic applicationsHOGER, I; GAWLIK, A; ANDRÄ, G et al.Journal of crystal growth. 2013, Vol 364, pp 164-168, issn 0022-0248, 5 p.Article

Solid phase epitaxy of silicon thin films by diode laser irradiation for photovoltaic applicationsSCHMIDT, T; HÖGER, I; GAWLIK, A et al.Thin solid films. 2012, Vol 520, Num 24, pp 7087-7092, issn 0040-6090, 6 p.Article

Transparent thin films of Bi2WO6, Bi4Ti3O12 and Sr0.75Ba0.25Nb2O6WOLLMANN, P; SCHUMM, B; KASKEL, S et al.Solid state sciences. 2012, Vol 14, Num 9, pp 1378-1384, issn 1293-2558, 7 p.Article

Drive current enhancement in p-tunnel FETs by optimization of the process conditionsLEONELLI, D; VANDOOREN, A; ROOYACKERS, R et al.Solid-state electronics. 2011, Vol 65-66, pp 28-32, issn 0038-1101, 5 p.Conference Paper

Solid phase epitaxial regrowth of amorphous silicon is not affected by structural relaxationROORDA, S; LAVIGUEUR, Y.Philosophical magazine (2003. Print). 2010, Vol 90, Num 29-30, pp 3787-3794, issn 1478-6435, 8 p.Article

Optimizing the growth of CoSi2 film with oxide-mediated CoSi2 template by silicon cap layerXU, M; VANTOMME, A; SMEETS, D et al.Journal of crystal growth. 2009, Vol 311, Num 16, pp 4007-4010, issn 0022-0248, 4 p.Article

X-ray photoelectron spectroscopy of SPE-grown bcc-Fe, polycrystal and β-FeSi2 phases on Si(111) surfacesHATTORI, Azusa N; HATTORI, Ken; DAIMON, Hiroshi et al.Surface and interface analysis. 2008, Vol 40, Num 6-7, pp 988-992, issn 0142-2421, 5 p.Conference Paper

Cathodoluminescence and epitaxy after laser annealing of Cs+-irradiated α-quartzSAHOO, P. K; GASIOREK, S; DHAR, S et al.Applied surface science. 2006, Vol 252, Num 13, pp 4477-4480, issn 0169-4332, 4 p.Conference Paper

Cathodoluminescence during epitaxy in Rb-ion irradiated α-quartzGASIOREK, S; SAHOO, P. K; DHAR, S et al.Applied physics. B, Lasers and optics (Print). 2006, Vol 84, Num 1-2, pp 357-363, issn 0946-2171, 7 p.Article

Epitaxial thickening of AIC poly-Si seed layers on glass by solid phase epitaxyWIDENBORG, Per I; STRAUB, Axel; ABERLE, Armin G et al.Journal of crystal growth. 2005, Vol 276, Num 1-2, pp 19-28, issn 0022-0248, 10 p.Article

Mechanism for heteroepitaxial growth of transparent P-type semiconductor: LaCuOS by reactive solid-phase epitaxyHIRAMATSU, Hidenori; OHTA, Hiromichi; SUZUKI, Toshiyuki et al.Crystal growth & design. 2004, Vol 4, Num 2, pp 301-307, issn 1528-7483, 7 p.Article

Fabrication of uniform poly-Si thin film on glass substrate by AICDOI, Atsutoshi.Thin solid films. 2004, Vol 451-52, pp 485-488, issn 0040-6090, 4 p.Conference Paper

Deterioration of aluminum induced crystallization of sputtered silicon by film stressHSU, Ching-Ming; YU, Ming-Chang.Journal of materials science letters. 2003, Vol 22, Num 15, pp 1079-1081, issn 0261-8028, 3 p.Article

Two-layer crystallization of amorphous YMnO3 thin films on Si (100) substratesDONG CHUL YOO; JEONG YONG LEE; IK SOO KIM et al.Journal of the American Ceramic Society. 2003, Vol 86, Num 1, pp 149-151, issn 0002-7820, 3 p.Article

Zero-mismatch temperature synthesis of NiSi2 by a metal vapor vacuum arc ion sourceHE, Y; FENG, J. Y; LI, W. Z et al.Journal of crystal growth. 2003, Vol 254, Num 1-2, pp 70-74, issn 0022-0248, 5 p.Article

Temperature dependence of the growth of super-grain polycrystalline silicon by metal induced crystallizationJONG HYUN CHOI; DO YOUNG KIM; SEONG JIN PARK et al.Thin solid films. 2003, Vol 427, Num 1-2, pp 289-293, issn 0040-6090, 5 p.Conference Paper

Crystallization kinetics of Ge4Sb1Te5 filmsWAMWANGI, D; NJOROGE, W. K; WUTTIG, M et al.Thin solid films. 2002, Vol 408, Num 1-2, pp 310-315, issn 0040-6090Article

Surface morphology of poly-Si films made by aluminium-induced crystallisation on glass substratesWIDENBORG, Per I; ABERLE, Armin G.Journal of crystal growth. 2002, Vol 242, Num 3-4, pp 270-282, issn 0022-0248Article

Modeling of grain growth kinetics with Read-Shockley grain boundary energy by a modified Monte Carlo algorithmQIANG YU; ESCHE, Sven K.Materials letters (General ed.). 2002, Vol 56, Num 1-2, pp 47-52, issn 0167-577X, 6 p.Article

Preparation of Ce1-xGdxO2-0.5x thin films by UV assisted sol-gel methodFANG, Q; ZHANG, J.-Y.Surface & coatings technology. 2002, Vol 151-52, pp 100-104, issn 0257-8972Conference Paper

Influence of nitrogen concentration on conductivity of N-doped a-SiC:H films deposited by PECVDHURAN, J; HOTOV, I; KOBZEV, A. P et al.Vacuum. 2002, Vol 67, Num 3-4, pp 567-570, issn 0042-207X, 4 p.Conference Paper

Aluminum-induced crystallization of amorphous siliconGALL, S; MUSKE, M; SIEBER, I et al.Journal of non-crystalline solids. 2002, Vol 299302, pp 741-745, issn 0022-3093, bConference Paper

Rapid crystallization of silicon films using pulsed current-induced joule heatingSAMESHIMA, T; KANEKO, Y; ANDOH, N et al.Journal of non-crystalline solids. 2002, Vol 299302, pp 746-750, issn 0022-3093, bConference Paper

Three-dimensional Monte-Carlo simulation of grain growth in Pt-Co thin filmSUNG IL PARK; SANG SOO HAN; HYOUNG GYU KIM et al.Journal of electronic materials. 2002, Vol 31, Num 10, pp 965-971, issn 0361-5235Conference Paper

Crystallization of sol-gel-derived barium strontium titanate thin filmsGUST, Maria C; MOMODA, Leslie A; EVANS, Neal D et al.Journal of the American Ceramic Society. 2001, Vol 84, Num 5, pp 1087-1092, issn 0002-7820Article

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