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Design-Dependent Process Monitoring for Wafer Manufacturing and Test Cost ReductionCHAN, Tuck-Boon; PANT, Aashish; CHENG, Lerong et al.IEEE transactions on semiconductor manufacturing. 2012, Vol 25, Num 3, pp 447-459, issn 0894-6507, 13 p.Article

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Study on the Dielectric Properties of Biological Cells Using the Electrokinetic MethodCHENG LIN; ZHONG LISHENG; ZHANG YUE et al.IEEJ transactions on electrical and electronic engineering. 2012, Vol 7, Num 5, pp 443-449, issn 1931-4973, 7 p.Article

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